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51. Technique de mesure du facteur de bruit différentiel avec un analyseur de réseau 4-ports

52. RF and broadband noise investigation in high-k/metal gate 28-nm CMOS bulk transistor

54. Extraction des performances AC et bruit HF d'une technologie CMOS 45 nm en gamme mmW

57. Noise characterization of mmW Si devices using classical and in-situ experimental set up

58. Tellurium delta-doped 120nm AlSb/InAs HEMTs : towards sub-100mV electronics

59. Mesures de bruit en gamme millimétrique : limitations et solutions

60. S-parameters measurements and small signal modeling of sub-65nm silicon MOSFETs up to 220 GHz

61. Erreurs de mesures liées à l'environnement des composants silicium RF « on-wafer » en bande millimétrique

62. TBH Si/SiGeC faible coût pour applications millimétriques

63. Noise in SOI MOSFETs and gate-all-around transistors

64. A 40 GHz single-ended down-conversion mixer in 0.13 µm SiGeC BiCMOS HBT

65. A 40 GHz superheterodyne receiver integrated in 0.13 µm BiCMOS SiGe:C HBT technology

66. Monte Carlo characterization of fabricated partially-depleted SOI MOSFETs : high-frequency performance

68. High frequency noise sources extraction in nanometric MOSFETs

71. Validation d'un modèle non linéaire pour MOSFET au moyen des mesures grand signal

72. Noise modelling of 0.25 µm fully depleted SOI MOSFETs

73. A new empirical non-linear model for SOI MOSFET

74. Noise modeling and measurement techniques in deep submicron SOI devices

75. Modélisation de bruit de phase d'oscillateurs à TECs

76. Issues in high frequency noise simulation for deep submicron MOSFET's

77. Thermal Noise in MOSFETs: A Two- or a Three-Parameter Noise Model?

78. Experimental Investigation of RF Noise Performance Improvement in Graded-Channel MOSFETs

79. High-Frequency Noise Performance of 60-nm Gate-Length FinFETs

80. A 7-dB 43-GHz CMOS distributed amplifier on high-resistivity SOI substrates

83. High-frequency and noise performances of 65-nm MOSFET at liquid nitrogen temperature

84. Numerical and Experimental Assessment of Charge Control in III–V Nano-Metal-Oxide-Semiconductor Field-Effect Transistor

85. Assessment of III–V MOSFET architectures for low power applications using static and dynamic numerical simulation

89. 80 GHz low noise amplifiers in 65nm CMOS SOI

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