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59. Depth Distribution of Defects in SiC PiN Diodes Formed Using Ion Implantation or Epitaxial Growth.

68. Corrigendum: “Sign of Hall coefficient in nearest-neighbor hopping conduction in heavily Al-doped p-type 4H-SiC” [Jpn. J. Appl. Phys. 59, 051004 (2020)]

69. 20 kV-Class Ultra-High Voltage 4H-SiC n-IE-IGBTs

70. Anomalous Temperature Dependence of the Hall Coefficient of Heavily Al-Doped 4H-SiC Epilayers in the Band Conduction Region

73. Anomalous Conduction between the Band and Nearest-Neighbor Hopping Conduction Regions in Heavily Al-Doped p-Type 4H-SiC

86. Dendritic Cells Pre-Pulsed with Wilms’ Tumor 1 in Optimized Culture for Cancer Vaccination

90. RND type efflux pump system MexAB-OprM of pseudomonas aeruginosa selects bacterial languages, 3-oxo-acyl-homoserine lactones, for cell-to-cell communication

92. Transition of conduction mechanism from band to variable-range hopping conduction due to Al doping in heavily Al-doped 4H-SiC epilayers

96. Relationship between Temperature Dependencies of Resistivity and Hall Coefficient in Heavily Al-Doped 4H-SiC Epilayers

99. Alkane inducible proteins in Geobacillus thermoleovorans B23

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