74 results on '"Tromas, C."'
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52. Out-of-plane magnetic patterning on austenitic stainless steels using plasma nitriding
53. Study of elementary deformation mechanisms in MgO induced by nanoindentation: experiments and simulation
54. Structure and mechanical properties of He-implanted SiC
55. Elastic stress field beneath an arbitrary axisymmetric punch
56. Nucleation of dislocations during nanoindentation in MgO
57. Pop-in phenomenon in MgO and LiF: Observation of dislocation structures
58. Mechanical and Nanomechanical Properties.
59. Study by atomic force microscopy of elementary deformation mechanisms involved in low load indentations in MgO crystals
60. Pop-in phenomenon during nanoindentation in MgO
61. Study of the mechanical properties of ceramic materials by the nanoindentation technique
62. A new technology for nanohardness measurements: principle and applications
63. Synthesis, Characterization, and Intrinsic Hardness of Layered Nanolaminate Ti3 AlC2 and Ti3 Al0.8 Sn0.2 C2 Solid Solution.
64. Structural Characterization of Self-Assembled Monolayers of Neoglycoconjugates Using Atomic Force Microscopy
65. Unusual room-temperature plasticity in silicon nanopillars
66. Self-organization and optical response of silver nanoparticles dispersed in a dielectric matrix
67. Toward the understanding of the brittle to ductile transition at low size in silicon: experiments and simulations
68. Track formation in amorphous Fe0.55Zr0.45 alloys irradiated by MeV C60 ions: Influence of intrinsic stress on induced surface deformations
69. Lattice instability and elastic response of metastable Mo1-xSix thin films.
70. Elastic strain mapping of plastically deformed materials by TEM.
71. A new method for measuring nanoparticle diameter from a set of SEM images using a remarkable point.
72. Development of a new hybrid approach combining AFM and SEM for the nanoparticle dimensional metrology.
73. Evidence of dislocation cross-slip in MAX phase deformed at high temperature.
74. Adhesion Forces between Lewis(X) Determinant Antigens as Measured by Atomic Force Microscopy.
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