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The HIPing of Ti-Al-1.9TiC and Ti-Al-0.2Sn-1.8TiC reactant mixtures yields Ti3AlC2 and Ti3Al0.8Sn0.2C2 solid solutions, respectively. Rietveld refinement gives a = 3.0786 ± 0.0001 Å and c = 18.589 ± 0.001 Å lattice parameters for Ti3AlC2 and a = 3.0837 ± 0.0001 Å and c = 18.621 ± 0.002 Å for Ti3Al0.8Sn0.2C2. Furthermore, about 2-3 vol% of Ti x Al y intermetallics is detected in Ti3Al0.8Sn0.2C2 solid solution. The intrinsic hardness, measured by nanoindention tests, is 11.4 ± 0.7 GPa for Ti3AlC2 and 10.2 ± 0.6 GPa for Ti3Al0.8Sn0.2C2. Furthermore, hardness values, measured by microindentation tests, are compared with the ones measured by nanoindentation. It is shown that microindentation and nanoindentation performed with large loads lead to underestimated hardness values as several grains are involved in the deformation process. Finally, Young's modulus of Ti3AlC2 and Ti3Al0.8Sn0.2C2 is 260 ± 10 and 250 ± 10 GPa, respectively. [ABSTRACT FROM AUTHOR]

Amorphous Fe0.55Zr0.45 films, having thickness of 400 nm, were grown on silicon substrates by co-deposition using ion beam sputtering. Limited surface roughness makes this system particularly suitable for fine-scale scanning force microscopy analysis and nano-indentation. The samples were irradiated with MeV C60 clusters, and the surface morphology of single impacts was found to have a “doughnut” shape, i.e. hillocks having a central crater. Quantitative evaluation of the deformation was achieved by measuring their height and diameter. When C60 projectiles deviate from normal incidence, a tail emerges along the direction of the incident beam. The height of the hillock and length of the tail are increasing with the incidence angle, and the magnitude of the deformation indicates that the damage mainly occurs due to a radial coherent mass transport outwards from the track core by a compression shockwave-like mechanism. The residual compressive in-plane stress, ∼−0.4 GPa for the as-deposited films, was found to notably influence the C60 induced plastic deformations. Indeed, stress relaxation results in a marked decrease in height combined with a significant widening of the surface features. This “flat” surface morphology is attributed to an enhanced radial efficiency of the pressure pulse, owing to a significant reduction of the hardness of the amorphous film after stress relaxation. The overall picture outlined from our observations suggests that the surface damage induced by single MeV C60 ions possibly is the signature of plastic deformation induced at large distances by an energetic radial pressure pulse. This unsteady shockwave allows the energy transfer outwards from the localised region along the ion path that experiences a sudden transient heating. [Copyright &y& Elsevier]

We present a detailed experimental study on Mo1-xSix thin films, an archetypal alloy system combining metallic and semiconductor materials. The correlations between structure and elastic response are comprehensively investigated. We focus on assessing trends for understanding the evolution of elastic properties upon Si alloying in relation to the structural state (crystalline vs amorphous), bonding character (metallic vs covalent), and local atomic environment. By combining picosecond ultrasonics and Brillouin light scattering techniques, a complete set of effective elastic constants and mechanical moduli (B, G, E) is provided in the whole compositional range, covering bcc solid solutions (x<0.20) and the amorphous phase (0.20

A method for mapping elastic strains by TEM in plastically deformed materials is presented. A characteristic feature of plastically deformed materials, which cannot be handled by standard strain measurement method, is the presence of orientation gradients. To circumvent this issue, we couple orientation and strain maps obtained from scanning precession electron diffraction datasets. More specifically, orientation gradients are taken into account by 1) identifying the diffraction spot positions in a reference pattern, 2) measuring the disorientation between the diffraction patterns in the map and the reference pattern, 3) rotating the coordinate system following the measured disorientation at each position in the map, 4) calculating strains in the rotated coordinate system. At present, only azimuthal rotations of the crystal are handled. The method is illustrated on a Cr 2 AlC monocrystal micropilar deformed in near simple flexion during a nanomechanical test. After plastic deformation, the sample contains dislocations arranged in pile-ups and walls. The strain-field around each dislocation is consistent with theory, and a clear difference is observed between the strain fields around pile-ups and walls. It is further remarked that strain maps allow for the orientation of the Burgers vector to be identified. Since the loading undergone by the sample is known, this also allows for the position of the dislocation sources to be estimated. Perspectives for the study of deformed materials are finally discussed., Competing Interests: Declaration of competing interest The authors declare that they have no known competing financial interests or personal relationships that could have appeared to influence the work reported in this paper., (Copyright © 2024 The Author(s). Published by Elsevier B.V. All rights reserved.)

Scanning Electron Microscopy (SEM) is considered as a reference technique for the determination of nanoparticle (NP) dimensional properties. Nevertheless, the image analysis is a critical step of SEM measuring process and the initial segmentation phase consisting in determining the contour of each nano-object to be measured must be correctly carried out in order to identify all pixels belonging to it. Several techniques can be applied to extract NP from SEM images and evaluate their diameter like thresholding or watershed. However, due to the lack of reference nanomaterials, few papers deals with the uncertainty associated with these segmentation methods. This article proposes a novel approach to extract the NP boundaries from SEM images using a remarkable point. The method is based on the observation that, by varying the electron beam size, the secondary electron profiles crosses each other at this point. First, a theoretical study has been performed using Monte Carlo simulation on silica NP to evaluate the robustness of the method compared with more conventional segmentation techniques (Active Contour or binarization at Full Width at Half-Maximum, FWHM). The simulation results show especially a systematic discrepancy between the NP real size and the measurements performed with both conventional methods. Moreover, generated errors are NP size-dependent. By contrast, it has been demonstrated that a very good agreement between measured and simulated diameters has been obtained with this new technique. As an example, this method of the remarkable point has been applied on SEM images of silica particles. The quality of the segmentation has been shown on silica reference nanoparticles by measuring the modal equivalent projected area diameter and comparing with calibration certificate. The results show that the NP contour can be very accurately delimited with using this point. The measurement uncertainty has been also reduced from 4.3 nm (k = 2) with conventional methods to 2.6 nm (k = 2) using the remarkable point., (Copyright © 2019 The Authors. Published by Elsevier B.V. All rights reserved.)

At this time, there is no instrument capable of measuring a nano-object along the three spatial dimensions with a controlled uncertainty. The combination of several instruments is thus necessary to metrologically characterize the dimensional properties of a nano-object. This paper proposes a new approach of hybrid metrology taking advantage of the complementary nature of atomic force microscopy (AFM) and scanning electron microscopy (SEM) techniques for measuring the main characteristic parameters of nanoparticle (NP) dimensions in 3D. The NP area equivalent, the minimal and the maximal Feret diameters are determined by SEM and the NP height is measured by AFM. In this context, a kind of new NP repositioning system consisting of a lithographed silicon substrate has been specifically developed. This device makes it possible to combine AFM and SEM size measurements performed exactly on the same set of NPs. In order to establish the proof-of-concept of this approach and assess the performance of both instruments, measurements were carried out on several samples of spherical silica NP populations ranging from 5 to 110 nm. The spherical nature of silica NPs imposes naturally the equality between their height and their lateral diameters. However, discrepancies between AFM and SEM measurements have been observed, showing significant deviation from sphericity as a function of the nanoparticle size.

Ti₂AlN nanolayered ternary alloy has been plastically deformed under confining pressure at 900°C. The dislocation configurations of the deformed material have been analyzed by transmission electron microscopy. The results show a drastic evolution compared to the dislocation configurations observed in the Ti₂AlN samples deformed at room temperature. In particular, they evidence out-of-basal-plane dislocations and interactions. Moreover numerous cross-slip events from basal plane to prismatic or pyramidal planes are observed. These original results are discussed in the context of the Brittle-to-Ductile Transition of the nanolayered ternary alloys.

The adhesion forces between individual molecules of Lewis(X) trisaccharide antigen (Le(X) ) have been measured in water and in calcium solution by using atomic force microscopy (AFM, see graph). These results demonstrate the self-recognition capability of this antigen, and reinforce the hypothesis that carbohydrate-carbohydrate interaction could be considered as the first step in the cell-adhesion process in nature., (Copyright © 2001 WILEY-VCH Verlag GmbH, Weinheim, Fed. Rep. of Germany.)