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A study was conducted to investigate the photodissociation of the hydroxymethyl radical to hydrogen atom and formaldehyde following excitation to the origin band of the Rydberg (super 2) A'(3p(sub 3)) state of jet cooled CH(sub 2) OD and CD(sub 2)OH. The studies observed anisotropic angular distribution, which suggested that the dissociation was fast as indicated by the line width.

A study of the formation processes and properties of nanocomposite materials consisting of indium nanoparticles in a thin film of the organic semiconductor copper tetrafluorophthalocyanine (CuPcF4) is presented. The results are obtained by the new setup for dynamic photoelectron spectroscopy, which allows the recording of spectra in a millisecond interval using the ARGUS photoelectron spectrometer and synchrotron radiation (PETRA III/DESY, Germany). The evolution of the core level (CL) spectra: C1s, N1s, and In3d5/2 recorded directly during the deposition of indium onto the CuPcF4 surface under ultrahigh vacuum conditions is traced. The thickness of the indium coating during deposition increased from 0 to 5 nm. In this range of coatings, more than 150 spectra are recorded for each CL with a recording rate of 0.1 s/spectrum. The following is established: the significant diffusion of indium atoms deep into the organic matrix is observed; in fact, no chemical interaction of indium with carbon atoms is found; indium atoms are located in places close to pyrrole nitrogen of the CuPcF4 molecule. Apparently, during the interaction of In atoms and pyrrole nitrogen atoms, a negative charge is transferred from indium to the CuPcF4 molecule. Thus, data on the fast-flowing processes of the formation of organometallic In–CuPcF4 interfaces are obtained. [ABSTRACT FROM AUTHOR]

An Erratum to this paper has been published: https://doi.org/10.1134/S1075701524030024 [ABSTRACT FROM AUTHOR]

The evolution of the morphology and the electronic structure of the hybrid organic-inorganic system composed of aluminum nanoparticles (NPs) distributed in an organic semiconductor matrix—copper phthalocyanine (CuPc)—as a function of nominal aluminum content was studied by transmission electron microscopy and by photoemission spectroscopy methods. The aluminum atoms deposited onto the CuPc surface diffuse into the organic matrix and self-assemble to NPs in a well-defined manner with a narrow diameter distribution, which depends on the amount of aluminum that is evaporated onto the CuPc film. We find clear evidence of a charge transfer from Al to CuPc and we have been able to determine the lattice sites where Al ions sit. The finally at high coverage about 64 Å the formation of metallic aluminum overlayer on CuPc thin film takes place. [ABSTRACT FROM AUTHOR]