101. Probing small unilamellar EggPC vesicles on mica surface by atomic force microscopy
- Author
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Xuemei Liang, K. Y. Simon Ng, and Guangzhao Mao
- Subjects
Light ,Lipid Bilayers ,Biophysics ,Analytical chemistry ,Modulus ,Microscopy, Atomic Force ,Biophysical Phenomena ,chemistry.chemical_compound ,Colloid and Surface Chemistry ,Planar ,Phosphatidylcholine ,Animals ,Scattering, Radiation ,Physical and Theoretical Chemistry ,Flexural modulus ,Vesicle ,Bilayer ,technology, industry, and agriculture ,Surfaces and Interfaces ,General Medicine ,Penetration (firestop) ,Models, Theoretical ,Egg Yolk ,Kinetics ,Cholesterol ,chemistry ,Phosphatidylcholines ,Adsorption ,Mica ,Biotechnology - Abstract
Sonicated small unilamellar egg yolk phosphatidylcholine (EggPC) vesicles were investigated using atomic force microscopy (AFM) imaging and force measurements. Three different topographies (convex, planar, and concave shape) of the EggPC vesicles on the mica surface were observed by tapping mode in fluid, respectively. It was found that the topography change of the vesicles could be attributed to the interaction force between the AFM tip and vesicles. Force curves between an AFM tip and an unruptured vesicle were obtained in contact mode. During approach, two breaks corresponding to the abrupt penetration of upper and lower bilayer of vesicle were exhibited in the force curve. Both breaks spanned a distance of around 4 nm close to the EggPC bilayer thickness. Based on Hertz analysis of AFM approach force curves, the Young’s modulus (E) and the bending modulus (kc) for pure EggPC vesicles were measured to be (1.97 ± 0.75) × 10 6 Pa and (0.21 ± 0.08) × 10 −19 J, respectively. The results show that the AFM can be used to obtain good images of intact and deformed vesicles by tapping mode, as well as to probe the integrity and bilayer structure of the vesicles. AFM force curve compare favorably with other methods to measure mechanical properties of soft samples with higher spatial resolution. © 2003 Elsevier B.V. All rights reserved.
- Published
- 2004