101. Ultra-large current transport in thick SmBa2Cu3O7−x films grown by reactive co-evaporation
- Author
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Gee Yeong Kim, Hye Jin Jin, Young-Sik Jo, Dong-Woo Ha, Hyeonsik Cheong, D.H. Nam, S.S. Oh, Rock-Kil Ko, Ho-Sup Kim, and William Jo
- Subjects
Materials science ,business.industry ,Scattering ,Energy Engineering and Power Technology ,Dissipation ,Condensed Matter Physics ,Evaporation (deposition) ,Electronic, Optical and Magnetic Materials ,symbols.namesake ,Thermoelectric effect ,Microscopy ,symbols ,Optoelectronics ,Grain boundary ,Electrical and Electronic Engineering ,business ,Raman spectroscopy ,Electrical conductor - Abstract
Structural and transport properties of high performance SmBa2Cu3O7−x coated conductors produced by a dual-chamber co-evaporation are presented. The 5 μm-thick SmBCO coated conductors grown on IBAD-MgO based Hastelloy metal templates show critical currents larger than 1020–1560 A/cm at 77 K and self-field. The current transport characteristics of the conductors are investigated by room-temperature thermoelectric microscopy and low-temperature bolometric microscopy. The local thermoelectric images show the tilted grains, grain boundaries, and microstructural defects on the surface of the coated conductors. The bias current-dependent bolometric response at low temperature displays the current of the local flux flow dissipation as an increasing bias. Furthermore, we measured micro-Raman scattering microscopic imaging on oxygen-related peaks of the conductors. Comparing the Raman signal images with the low temperature optical scanning maps, it is remarkable that the structural disorders represented by oxygen-related Raman peaks are closely related to the low temperature bolometric abnormalities. From this result, a nature of the dissipative current distribution in coated conductors is revealed. The scanning optical microscopic study will provide a promising method for quality assurance of coated conductors.
- Published
- 2015