Search

Your search keyword '"Baumbach, T."' showing total 691 results

Search Constraints

Start Over You searched for: Author "Baumbach, T." Remove constraint Author: "Baumbach, T."
691 results on '"Baumbach, T."'

Search Results

151. In-plane strain and strain relaxation in laterally patterned periodic arrays of protect (Si/SiGe) quantum wires and dot arrays

154. Potential use of V-channel Ge(220) monochromators in X-ray metrology and imaging

155. Towards a Cryogen Free Superconducting Switch

159. X-ray diffraction imaging for predictive metrology of crack propagation in 450-mm diameter silicon wafers

167. A versatile indirect detector design for hard X-ray microimaging

177. Real‐time X‐ray diffraction imaging for semiconductor wafer metrology and high temperature in situ experiments

184. Development of Superconducting Undulators at ANKA

191. Dislocation sources and slip band nucleation from indents on silicon wafers

193. Comparative study of multilayers used in monochromators for synchrotron-based coherent hard X-ray imaging

198. A synchrotron tensile test setup for nanocrystalline thin films

Catalog

Books, media, physical & digital resources