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565 results on '"Tahoori, Mehdi B."'

210. Runtime Adjustment of IoT System-on-Chips for Minimum Energy Operation.

Author

Golanbari, Mohammad Saber and Tahoori, Mehdi B.

Subjects
INTERNET of things, ENERGY consumption, VOLTAGE, MACHINE learning, COMPUTER firmware
Abstract

Energy-constrained Systems-on-Chips (SoC) are becoming major components of many emerging applications, especially in the Internet of Things (IoT) domain. Although the best energy e!ciency is achieved when the SoC operates in the near-threshold region, the best operating point for maximum energy e!ciency could vary depending on operating temperature, workload, and the power-gating state (power modes) of various SoC components at runtime. This paper presents a lightweight machine-learning based scheme to predict and tune the SoC to the most energy efficient supply voltage at the firmware level during runtime, considering the impacts of temperature variation and power-gating of SoC components while meeting the performance and reliability requirements. Simulation results indicate that the proposed method can determine the most energy efficient supply voltage of a circuit with high-accuracy (RMSE = 7mV), while considering the runtime performance and reliability constraints. [ABSTRACT FROM AUTHOR]

Published
2018
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211. Comprehensive analysis of alpha and neutron particle-induced soft errors in an embedded processor at nanoscales

Author

Ebrahimi, M., Evans, A., Tahoori, Mehdi B., Seyyedi, R., Costenaro, E., Alexandrescu, D., Department of Agricultural Biotechnology, Payam-e-Noor University Karaj Branch, IMA (KARLSRUHE UNIV.), Karlsruhe Univ., Techniques of Informatics and Microelectronics for integrated systems Architecture (TIMA), Institut polytechnique de Grenoble - Grenoble Institute of Technology (Grenoble INP)-Centre National de la Recherche Scientifique (CNRS)-Université Grenoble Alpes (UGA), iROc Technologies (IROC TECHNOLOGIES), Cadence Connection-EDA Consortium-FSA-Cubic Micro, Karlsruhe Institute of Technology (KIT), Techniques de l'Informatique et de la Microélectronique pour l'Architecture des systèmes intégrés (TIMA), and Université Joseph Fourier - Grenoble 1 (UJF)-Institut polytechnique de Grenoble - Grenoble Institute of Technology (Grenoble INP )-Centre National de la Recherche Scientifique (CNRS)

Subjects
analytical-testing, 010302 applied physics, Pacs 85.40, Soft Error, 020208 electrical & electronic engineering, 0103 physical sciences, analysis-flow, 0202 electrical engineering, electronic engineering, information engineering, Hardware_PERFORMANCEANDRELIABILITY, 02 engineering and technology, [SPI.NANO]Engineering Sciences [physics]/Micro and nanotechnologies/Microelectronics, 01 natural sciences, 020202 computer hardware & architecture
Abstract

International audience; Radiation-induced soft errors have become a key challenge in advanced commercial electronic components and systems. We present results of Soft Error Rate (SER) analysis of an embedded processor. Our SER analysis platform accurately models all generation, propagation and masking effects starting from a technology response model derived using TCAD simulations at the device level all the way to application masking. The platform employs a combination of empirical models at the device level, analytical error propagation at logic level and fault emulation at the architecture/application level to provide the detailed contribution of each component (flip-flops, combinational gates, and SRAMs) to the overall SER. At each stage in the modeling hierarchy, an appropriate level of abstraction is used to propagate the effect of errors to the next higher level. Unlike previous studies which are based on very simple test chips, analyzing the entire processor gives more insight into the contributions of different components to the overall SER. The results of this analysis can assist circuit designers to adopt effective hardening techniques to reduce the overall SER while meeting required power and performance constraints.

Published
2014

229. Error Propagation Aware Timing Relaxation For Approximate Near Threshold Computing.

Author

Gebregiorgis, Anteneh, Kiamehr, Saman, and Tahoori, Mehdi B.

Subjects
ERROR probability, THRESHOLD energy, THRESHOLD voltage, QUANTUM computers, QUANTUM computing
Abstract

Near threshold computing (NTC) through aggressive supply voltage scaling has the potential to significantly improve energy-efficiency. However, the increase in variation-induced timing errors is a major challenge in NTC. This can be addressed in the scope of approximate computing by selectively embracing non-important variation-induced timing errors. In this paper, we propose a framework to leverage the error tolerance potential of approximate computing for energy-efficient NTC designs. In our framework, statistical timing error analysis as well as structural and functional error propagation analysis is performed to identify the approximable portion of a design. Then, a mixed-timing logic synthesis is employed to improve energy-efficiency by embracing errors in the approximable portion of the design. Experimental results show that the proposed approach can improve the energy-efficiency of NTC designs by more than 30%. [ABSTRACT FROM AUTHOR]

Published
2017
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237. Towards a Hierarchical and Scalable Approach for Modeling the Effects of SETs

Author

Costenaro, E., Evans, A., Alexandrescu, D., Chen, Lin, Tahoori, Mehdi B., Nicolaidis, M., Torella, Lucie, iROc Technologies (IROC TECHNOLOGIES), Cadence Connection-EDA Consortium-FSA-Cubic Micro, School of Chemical and Physical Sciences [Keele], Keele University [Keele], Techniques de l'Informatique et de la Microélectronique pour l'Architecture des systèmes intégrés (TIMA), Université Joseph Fourier - Grenoble 1 (UJF)-Institut polytechnique de Grenoble - Grenoble Institute of Technology (Grenoble INP )-Centre National de la Recherche Scientifique (CNRS), Karlsruhe Institute of Technology (KIT), Techniques of Informatics and Microelectronics for integrated systems Architecture (TIMA), Institut polytechnique de Grenoble - Grenoble Institute of Technology (Grenoble INP)-Centre National de la Recherche Scientifique (CNRS)-Université Grenoble Alpes (UGA), IMA (KARLSRUHE UNIV.), and Karlsruhe Univ.

Subjects
PACS 85.42, [SPI.NANO] Engineering Sciences [physics]/Micro and nanotechnologies/Microelectronics, modeling, [SPI.NANO]Engineering Sciences [physics]/Micro and nanotechnologies/Microelectronics, ComputingMilieux_MISCELLANEOUS, SET-effects
Abstract

International audience

Published
2013

242. Application-aware cross-layer reliability analysis and optimization

Author

Glaß, Michael, primary, Aliee, Hananeh, additional, Chen, Liang, additional, Ebrahimi, Mojtaba, additional, Khosravi, Faramarz, additional, Kleeberger, Veit B., additional, Listl, Alexandra, additional, Müller-Gritschneder, Daniel, additional, Oboril, Fabian, additional, Schlichtmann, Ulf, additional, Tahoori, Mehdi B., additional, Teich, Jürgen, additional, Wehn, Norbert, additional, and Weis, Christian, additional

Published
2015
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