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1,241 results on '"nanometrology"'

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201. Precession electron diffraction & automated crystallite orientation/phase mapping in a transmission electron microscope.

202. Understanding Imaging and Metrology with the Helium Ion Microscope.

203. Metrology And Standardization For Nanotechnologies.

204. Transient Dynamical-Thermal-Optical System Modeling and Simulation.

205. 3 Dimensional Motion of Photon and Its Energy.

206. Pulse nonlinear optical switching in plasmonic structures.

207. Distinctive sensing nanotool for free and nanoencapsulated quercetin discrimination based on S,N co-doped graphene dots.

208. Analysis of a Casimir-driven parametric amplifier with resilience to Casimir pull-in for MEMS single-point magnetic gradiometry

209. Discrimination of nano-objects via cluster analysis techniques applied to time-resolved thermo-acoustic microscopy

210. Carbon dots – Separative techniques: Tools-objective towards green analytical nanometrology focused on bioanalysis

211. Anti-Stokes Raman Scattering of Single Carbyne Chains

212. Détermination des performances de la plateforme NanoBioAnalytique pour la détection et la caractérisation de vésicules extracellulaires : exploration de lysats plaquettaires humain à visée neuroprotectrice

213. Traceable and Precise Displacement Measurements with Microwave Cavities

214. Dual-Polarization Interferometry: A Novel Technique To Light up the Nanomolecular World.

215. Micro- and nanocoordinate measurements of micro-parts with 3-D tunnelling current probing.

216. The Breakdown Characteristics of Multigap Pseudospark Under Nanosecond Pulsed Voltages.

217. Traceable GISAXS measurements for pitch determination of a 25 nm self-assembled polymer grating.

218. Identification of Nanoparticles and the Measurement of their Concentration in Thin Films of Nanostructurized Polymers.

219. Second- and Third-order Raman Scattering in Bulk and Glass-embedded Nanometric CdS1 – xSex Crystals.

220. Using Grazing Incidence Small-Angle X-Ray Scattering (GISAXS) for Semiconductor Nanometrology and Defect Quantification

221. Precision Photoelectric Displacement Transducers in Nanometry.

222. Study on diffraction efficiency of Cr nanograting prepared by laser-focused atomic deposition

223. The effects of thermocompression bonding on Si/ SiO2 multilayer thin-film based critical dimension structures

224. One-step control of hierarchy and functionality of polymeric surfaces in a new plasma nanotechnology reactor

225. Investigation on the thermal effects during nanometric cutting process while using nanoscale diamond tools.

226. Genesis of nanometric illite crystals elucidated by light-element (hydrogen, lithium, boron and oxygen) isotope tracing, and K–Ar and Rb–Sr dating.

227. Planar super-oscillatory lens for sub-diffraction optical needles at violet wavelengths.

228. Interactions of porphyrins and single walled carbon nanotubes: A fine duet.

229. Analysis the Performance of Controllers for He-Ne Laser Stabilization by Combination of Frequency Locking and Power Balanced Methods for Nano-Metrology Applications.

230. Characterization of an in-vacuum PILATUS 1M detector.

231. Analysis of (NH)MoO·4HO thermal decomposition in argon.

232. Sarcomere length nanometry in rat neonatal cardiomyocytes expressed with a-actinin-AcGFP in Z discs.

233. Synchronizing a single-electron shuttle to an external drive.

234. Micro-nanometrologically and Topographic Characterization of Nanostructured Surfaces.

235. Investigations of the influence of common approximations in scatterometry for dimensional nanometrology.

236. Ellipsometric Technique for Estimating the Thickness Nonuniformity of Thin-Film Coatings.

237. A Novel Plate-Like Sensor Utilizing Curvature-Based Stiffening for Nanometrology Applications

238. Size measurement of silica nanoparticles by Asymmetric Flow Field-Flow Fractionation coupled to Multi-Angle Light Scattering: A comparison exercise between two metrological institutes

239. How levelling and scan line corrections ruin roughness measurement and how to prevent it

240. Ultra-low landing energy scanning electron microscopy for nanoengineering applications and metrology

241. 100 pT/cm single-point MEMS magnetic gradiometer from a commercial accelerometer

242. An intercomparison exercise of good laboratory practices for nano-aerosols sizemeasurements by mobility spectrometers

243. Laser-Driven Light Sources for Nanometrology Applications

244. Comparison of the chemical and micromechanical properties of Larix spp. after eco-friendly heat treatments measured by in situ nanoindentation

245. New imaging modes for analyzing suspended ultra-thin membranes by double-tip scanning probe microscopy

246. Metrology for the next generation of semiconductor devices

248. DNA Origami Nanophotonics and Plasmonics at Interfaces

249. A novel capacitive absolute positioning sensor based on time grating with nanometer resolution

250. spICP-MS assessment of ZnONPs and TiO2NPs in moisturisers after a tip sonication sample pre-treatment.

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