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A sixth-order theory of wave aberrations for axially symmetric systems is developed. Specific formulas for the sixth-order extrinsic and intrinsic wave aberration coefficients are given, as well as relations between pupil and image aberrations. Equations are developed for the wavefront propagation to the sixth order of approximation. The concept of the irradiance function is developed, and the second-order irradiance coefficients are found via conservation of flux at the pupils of the optical system and in terms of pupil aberrations. From purely geometrical considerations a generalized irradiance transport equation that describes irradiance changes in an optical system is derived. Confirming the aberration coefficients with real ray-tracing data was found to be indispensable. OCIS codes: 080.1005, 080.1010, 080.2740, 110.2990, 350.5500.

We present a procedure that compensates for phase aberrations in digital holographic microscopy by computing a polynomial phase mask directly from the hologram. The phase-mask parameters are computed automatically without knowledge of physical values such as wave vectors, focal lengths, or distances. This method enables one to reconstruct correct and accurate phase distributions, even in the presence of strong and high-order aberrations. Examples of applications are shown for microlens imaging and for compensating for the deformations associated with a tilted thick plate. Finally we show that this method allows compensation for the curvature of the specimen, revealing its surface defects and roughness. Examples of applications are shown for microlenses and metallic sphere imaging. OCIS codes: 090.1760, 090.1000, 180.0180, 120.5050, 120.3620.