1. Mutually Injection Locked Multi-Element Terahertz Oscillator Based on AlGaN/GaN High Electron Mobility Avalanche Transit Time Devices
- Author
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Partha Banerjee, Aritra Acharyya, Rajib Das, Arindam Biswas, Anup Kumar Bhattacharjee, Saurav Mallik, Haya Mesfer Alshahrani, E. Elshiekh, Mohamed Abbas, and Ben Othman Soufiene
- Subjects
2-DEG ,AlGaN/GaN ,coupling circuit ,HEM-ATT ,injection locking ,monolithic integration ,Electrical engineering. Electronics. Nuclear engineering ,TK1-9971 - Abstract
The paper investigates the terahertz performance of a mutually injection-locked multi-element high electron mobility avalanche transit time (HEM-ATT) source based on AlGaN/GaN two-dimensional electron gas (2-DEG). Utilizing a nanostrip patch type planar coupling circuit, mutual injection locking between adjacent elements is achieved. The paper provides a comprehensive analysis of the integrated power combining technique in the mutually injection-locked multi-element HEM-ATT oscillator. A ten-element mutually injection-locked integrated power combined source is designed for operation at 1.0 THz, and simulation studies are conducted to examine its DC, large-signal, and avalanche noise characteristics. The capability of generating a narrow-band terahertz wave is verified by introducing various levels of structural mismatches between the elements. Results indicate that the ten-element HEM-ATT oscillator can deliver 2.27 W peak power with a 17% DC to THz conversion efficiency at 1.0 THz. The average noise measure of the oscillator is found to be 12.54 dB. Additionally, the terahertz performance of the mutually injection-locked ten-element HEM-ATT oscillator is compared with other state-of-the-art THz sources to evaluate its potentiality as an excellent integrated THz radiator.
- Published
- 2024
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