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In this paper, we have studied the effect on the structure and magnetic properties of partial Pd substitution by Gd in Fe–Pd thin films of nominal composition Fe56Pd44−xGdx (x = 1, 3, 5, and 7), deposited onto Si(100) and Si(100)/SiO2 substrates by thermal evaporation. Several techniques contribute to the characterization of their microstructure and magnetic properties, such as x-ray diffraction (XRD), scanning electron microscopy, alternating gradient field magnetometry, and magnetic force microscopy (MFM). X-ray diffraction shows that the as-deposited films are either amorphous or contain a disordered FePd phase, depending on the film thickness. The transformation of disordered fcc-FePd into ordered fct-FePd has been induced by a heat treatment at 530 °C for 4 h. The addition of gadolinium leads to a reduction in the coercivity as a consequence of the emergence of soft phases and of the progressive reduction of the fct-FePd phase, which is primarily responsible for the observed maze magnetic domains. The exchange coupling between the soft phase and the hard fct-FePd phase is demonstrated by first-order reversal curves (FORCs). [ABSTRACT FROM AUTHOR]