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2. X-ray Diffractometry in Forensic Science

11. Mineralogy, provenance, and diagenesis of a potassic basaltic sandstone on Mars: CheMin X-ray diffraction of the Windjana sample (Kimberley area, Gale Crater).

12. The origin and implications of clay minerals from Yellowknife Bay, Gale crater, Mars

15. Multilevel atomic structural model for interstratified opal materials.

18. A channel sampling strategy for measurement of mineral modal and chemical composition of drill cores: application to lower oceanic crustal rocks from IODP Expedition 345 to the Hess Deep rift

19. Improved Matrix Methodology for Calculating Diffraction Intensity Profiles from Interstratified Phyllosilicates

32. Crystal structure determination of orthorhombic variscite2O and its derivative AlPO4 structure at high temperature.

39. [MATHEMATICAL EXPRESSION NOT REPRODUCIBLE IN ASCII]-dependent structural phase transitions in the zeolite mesolite: real- and reciprocal-space crystal structure refinements

40. Structure determination of the 2.5 hydrate MgS[O.sub.4] phase by simulated annealing

41. Determination of the crystal structure of sanderite, MgS[O.sub.4] x 2[H.sub.2]O, by X-ray powder diffraction and the charge flipping method

42. The H.sub.2O and CO.sub.2 adsorption properties of phyllosilicate-poor palagonitic dust and smectites under martian environmental conditions

44. A [MATHEMATICAL EXPRESSION NOT REPRODUCIBLE IN ASCII]-dependent structural phase transition in the zeolite natrolite

45. Sulfur-bearing Phases Detected by Evolved Gas Analysis of the Rocknest Aeolian Deposit, Gale Crater, Mars

46. Synchrotron powder X-ray diffraction study of the structure and dehydration behavior of sepiolite

47. Terrestrial Analogs for Clay Minerals at Yellowknife Bay, Gale Crater, Mars

48. The First X-ray Diffraction Patterns of Clay Minerals from Gale Crater

49. The XRD Amorphous Component in John Klein Drill Fines at Yellowknife Bay, Gale Crater, Mars

50. Characterizing the Phyllosilicates and Amorphous Phases Found by MSL Using Laboratory XRD and EGA Measurements of Natural and Synthetic Materials

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