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Your search keyword '"Bocko, Mark V."' showing total 6 results
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6 results on '"Bocko, Mark V."'

1. Transmission imaging measurements at 188 GHz with 0.35μm CMOS technology

Author

Sacco, Andrew P., additional, Newman, J. Daniel, additional, Lee, Paul P. K., additional, Fourspring, Kenneth D., additional, Osborn, John H., additional, Fiete, Robert D., additional, Bocko, Mark V., additional, Ignjatovic, Zeljko, additional, Pipher, Judith L., additional, McMurtry, Craig W., additional, Zhang, Xi-Cheng, additional, Dayalu, Jagannath, additional, Seery, Katherine, additional, Zhang, Chao X., additional, Bhandari, Sahil, additional, and Ninkov, Zoran, additional

Published
2015
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2. Compact THz imaging detector

Author

Newman, J. Daniel, primary, Lee, Paul P. K., additional, Sacco, Andrew P., additional, Chamberlain, Thomas B., additional, Willems, Dave A., additional, Fiete, Robert D., additional, Bocko, Mark V., additional, Ignotovic, Zeljko, additional, Pipher, Judith L., additional, McMurtry, Craig W., additional, Zhang, Xi-Cheng, additional, Rhodes, David B., additional, and Ninkov, Zoran, additional

Published
2013
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4. Transmission imaging measurements at 188 GHz with 0.35μm CMOS technology

Author

Anwar, Mehdi F., Crowe, Thomas W., Manzur, Tariq, Sacco, Andrew P., Newman, J. Daniel, Lee, Paul P. K., Fourspring, Kenneth D., Osborn, John H., Fiete, Robert D., Bocko, Mark V., Ignjatovic, Zeljko, Pipher, Judith L., McMurtry, Craig W., Zhang, Xi-Cheng, Dayalu, Jagannath, Seery, Katherine, Zhang, Chao X., Bhandari, Sahil, and Ninkov, Zoran

Published
2015
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5. Compact THz imaging detector

Author

Anwar, Mehdi F., Crowe, Thomas W., Manzur, Tariq, Newman, J. Daniel, Lee, Paul P. K., Sacco, Andrew P., Chamberlain, Thomas B., Willems, Dave A., Fiete, Robert D., Bocko, Mark V., Ignotovic, Zeljko, Pipher, Judith L., McMurtry, Craig W., Zhang, Xi-Cheng, Rhodes, David B., and Ninkov, Zoran

Published
2013
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6. Laser speckle MTF processing and test development for VIS and IR sensors

Author

Lee, Paul P. K., McMurtry, Craig W., Tan, Edwin J., Pipher, Judith L., Bocko, Mark V., and Newman, J. Daniel

Abstract

Using band-limited LASER speckle to measure the Modulation Transfer Function (MTF) of an image sensor offers simplified procedure and inexpensive laboratory set up compared with the traditional method of using a knife edge on the sensor imaging plane. This speckle technique has been previously demonstrated by Glen Boreman's group on devices in the visible range. We have extended the procedure to short-wave infrared (IR) sensor at 1.55 micron. Similar measurements were also made at 532 nanometer on a commercial visible (VIS) sensor. The experiments show that the LASER speckle method to be accurate when compared to knife-edge measurements for data below Nyquist. The measured MTF data support optical system design and image quality modeling for both VIS and IR sensing applications.

Published
2012
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