24 results on '"Borowik, Łukasz"'
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2. GaN/InGaN LED Sidewall Defects Analysis by Cathodoluminescence and Photosensitive Kelvin Probe Force Microscopy.
3. Influence of Shape and Size on GaN/InGaN μLED Light Emission: A Competition between Sidewall Defects and Light Extraction Efficiency
4. Kelvin Probe Force Microscopy under Variable Illumination: A Novel Technique To Unveil Charge Carrier Dynamics in GaN
5. 200 mm-scale growth of 2D layered GaSe with preferential orientation
6. Controlled synthesis of SiC nanoparticles from surface silicon contamination
7. Hidden surface photovoltages revealed by pump probe KPFM
8. Correlative analysis of embedded silicon interface passivation by Kelvin probe force microscopy and corona oxide characterization of semiconductor
9. Selective area growth of AlGaN nanopyramids by conventional and pulsed MOVPE
10. A scanning probe microscopy study of nanostructured TiO2/poly(3-hexylthiophene) hybrid heterojunctions for photovoltaic applications
11. Numerical analysis of single-point spectroscopy curves used in photo-carrier dynamics measurements by Kelvin probe force microscopy under frequency-modulated excitation
12. Calibrated work function mapping by Kelvin probe force microscopy
13. Environment and baking influence on charge retention on silicon nitride charge trap layers.
14. Techniques de mesure de grandeurs électriques adaptées aux nanocircuits
15. Photo-Carrier Multi-Dynamical Imaging at the Nanometer Scale in Organic and Inorganic Solar Cells
16. The influence of strain on dewetting of silicon films.
17. Work Function Measurement of Silicon Germanium Heterostructures Combining Kelvin Force Microscopy and X-ray Photoelectron Emission Microscopy
18. Method for making semi-conductor nanocrystals oriented along a predefined direction
19. Method for making semi-conductor nanocrystals
20. Étude de propriétés électroniques de nanostructures par microscopie à force atomique sous ultra-vide
21. Study of electronic properties of nanostructures by ultrahigh vacuum atomic force microscopy
22. Calculating Kelvin force microscopy signals from static force fields
23. From Solid-State Dewetting of Ultrathin, Compressively Strained Silicon–Germanium-on-Insulator Films to Mastering the Stoichiometry of Si1–xGexNanocrystals
24. A scanning probe microscopy study of nanostructured TiO 2 /poly(3-hexylthiophene) hybrid heterojunctions for photovoltaic applications.
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