14 results on '"Bourgeat, Johan"'
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2. Analysis of input receiver transistors behavior during a CDM event
3. Single and compact ESD device Beta-Matrix solution based on bidirectional SCR Network in advanced 28/32 nm technology node
4. Estimation of Oxide Breakdown Voltage During a CDM Event Using Very Fast Transmission Line Pulse and Transmission Line Pulse Measurements
5. Study of Inter-Power Domain Failures during a CDM Event
6. Towards a TCAD Model for NMOS Drivers in 28FDSOI under TLP & (vf)-TLP Transient Condition
7. Ultracompact ESD Protection With BIMOS-Merged Dual Back-to-Back SCR in Hybrid Bulk 28-nm FD-SOI Advanced CMOS Technology
8. ESD protection structure enhancement against Latch-Up issue using TCAD simulation
9. Generic Electrostatic Discharges Protection Solutions for RF and Millimeter-Wave Applications
10. Self-ESD-protected transmission line broadband in CMOS28nm UTBB-FDSOI
11. Local ESD protection structure based on Silicon Controlled Rectifier achieving very low overshoot voltage
12. New Beta-Matrix topology in CMOS32nm and beyond for ESD/LU improvement
13. High swing low capacitance ESD RF protections in advanced CMOS technologies
14. Point to point ESD protection network, a flexible and competitive strategy demonstrated in advanced CMOS technology.
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