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A quantitative analysis of the effect of strain on image reconstruction in Bragg coherent X-ray diffraction imaging and ptychography reveals reconstruction artifacts caused by the limited spatial resolution. With the modulus homogenization constraint applied, the reconstruction artifacts are efficiently removed and an Fe–Al alloy sample with strong strain that features π phase steps due to anti-phase domain boundaries is successfully reconstructed., A quantitative analysis of the effect of strain on phase retrieval in Bragg coherent X-ray diffraction imaging is reported. It is shown in reconstruction simulations that the phase maps of objects with strong step-like phase changes are more precisely retrieved than the corresponding modulus values. The simulations suggest that the reconstruction precision for both phase and modulus can be improved by employing a modulus homogenization (MH) constraint. This approach was tested on experimental data from a highly strained Fe–Al crystal which also features antiphase domain boundaries yielding characteristic π phase shifts of the (001) superlattice reflection. The impact of MH is significant and this study outlines a successful method towards imaging of strong phase objects using the next generation of coherent X-ray sources, including X-ray free-electron lasers.

International audience; This two-part article series provides a generalized description of the scattering geometry of Bragg coherent diffraction imaging (BCDI) experiments, the shear distortion effects inherent in the 3D image obtained from presently used methods and strategies to mitigate this distortion. Part I starts from fundamental considerations to present the general real-space coordinate transformation required to correct this shear, in a compact operator formulation that easily lends itself to implementation with available software packages. Such a transformation, applied as a final post-processing step following phase retrieval, is crucial for arriving at an undistorted, correctly oriented and physically meaningful image of the 3D crystalline scatterer. As the relevance of BCDI grows in the field of materials characterization, the available sparse literature that addresses the geometric theory of BCDI and the subsequent analysis methods are generalized here. This geometrical aspect, specific to coherent Bragg diffraction and absent in 2D transmission CDI experiments, gains particular importance when it comes to spatially resolved characterization of 3D crystalline materials in a reliable nondestructive manner. This series of articles describes this theory, from the diffraction in Bragg geometry to the corrections needed to obtain a properly rendered digital image of the 3D scatterer. Part I of this series provides the experimental BCDI community with the general form of the 3D real-space distortions in the phase-retrieved object, along with the necessary post-retrieval correction method. Part II builds upon the geometric theory developed in Part I with the formalism to correct the shear distortions directly on an orthogonal grid within the phase-retrieval algorithm itself, allowing more physically realistic constraints to be applied. Taken together, Parts I and II provide the X-ray science community with a set of generalized BCDI shear-correction techniques crucial to the final rendering of a 3D crystalline scatterer and for the development of new BCDI methods and experiments.

X-ray Bragg coherent diffraction imaging (BCDI) has been demonstrated as a powerful 3D microscopy approach for the investigation of sub-micrometre-scale crystalline particles. The approach is based on the measurement of a series of coherent Bragg diffraction intensity patterns that are numerically inverted to retrieve an image of the spatial distribution of the relative phase and amplitude of the Bragg structure factor of the diffracting sample. This 3D information, which is collected through an angular rotation of the sample, is necessarily obtained in a non-orthogonal frame in Fourier space that must be eventually reconciled. To deal with this, the approach currently favored by practitioners (detailed in Part I) is to perform the entire inversion in conjugate non-orthogonal real- and Fourier-space frames, and to transform the 3D sample image into an orthogonal frame as a post-processing step for result analysis. In this article, which is a direct follow-up of Part I, two different transformation strategies are demonstrated, which enable the entire inversion procedure of the measured data set to be performed in an orthogonal frame. The new approaches described here build mathematical and numerical frameworks that apply to the cases of evenly and non-evenly sampled data along the direction of sample rotation (i.e. the rocking curve). The value of these methods is that they rely on the experimental geometry, and they incorporate significantly more information about that geometry into the design of the phase-retrieval Fourier transformation than the strategy presented in Part I. Two important outcomes are (1) that the resulting sample image is correctly interpreted in a shear-free frame and (2) physically realistic constraints of BCDI phase retrieval that are difficult to implement with current methods are easily incorporated. Computing scripts are also given to aid readers in the implementation of the proposed formalisms.

Ptychography is a coherent diffraction imaging technique which aims in retrieving the lost phase from intensity-only far-field measurements. The versatility of the approach has proved an important asset for 3D mapping of different physical quantities, like the electron density of micrometer-sized specimens with resolution in the 10 - 100nm range. In this work, we explored the possibility to push further the current limits of 3D Bragg ptychography, by addressing the case of an extended InP/InGaAs nanostructured thin film, bonded on a silicon wafer. The experiment was performed at the ID13 beamline at ESRF, with a monochromatic beam focused down to 100nm. 2D intensity patterns were acquired at several incidence angles in the vicinity of the InP (004) Bragg peak, stacking up a three dimensional dataset. Numerical analysis of the given problem was performed beforehand in order to optimize the inversion strategy and study the possibility of introducing additional physical constraints through regularization approaches. Inversions of the dataset were done using a ptychographical gradient-based optimization phase retrieval algorithm. The developed strategy was applied on the experimental data which led to the retrieval of a complex-valued 3D image. The result exhibits the high crystallinity quality of the sample with the expected values of thickness and lattice mismatch, nevertheless, small local lattice tilts have been observed - in the order of 0.02°- and confirmed by numerical modeling. This result demonstrates the high sensitivity of the technique, as well as its exciting perspectives for imaging complex organic and inorganic nanostructured materials., La ptychographie est une technique d’imagerie par diffraction cohérente qui vise à récupérer la phase perdue, uniquement par des mesures d’intensité en champ lointain. Cette technique permet l’imagerie des champs de déformation dans des cristaux périodiques avec des résolutions sous-faisceau. Dans ce travail, la ptychographie de Bragg en 3D est utilisée pour étudier les propriétés d’une couche cristalline nanostructurée de InP/InGaAs collée sur un substrat de silicium. L’expérience a été réalisée sur la ligne ID13 de l’ESRF, avec un faisceau monochromatique concentré à 100nm. Les intensités 2D ont été acquises avec plusieurs angles d’incidence dans le voisinage du pic de Bragg InP (004), empilant un jeu de données tridimensionnelles. L’analyse numérique du problème donné a été effectuée à l’avance afin d’optimiser la stratégie d’inversion et d’étudier la possibilité d’introduire des contraintes physiques supplémentaires basées sur des approches de régularisation. L’inversion de l’ensemble des données a été effectuée en utilisant un algorithme ptychographique de reconstruction de phase. L’image 3D récupérée représente la haute qualité cristalline de l’échantillon, avec les valeurs de l’épaisseur et du désaccord de maille attendus en moyenne. Néanmoins, de petites inclinaisons locales de mailles ont été observées - de l’ordre de 0.02°- et confirmées par modélisation numérique. Les résultats démontrent la sensibilité de la technique, ainsi que ses perspectives passionnantes pour l’imagerie des matériaux organiques et inorganiques nanostructurés complexes.

International audience; We report the 3D mapping of strain and tilts of crystal planes in an extended InP nanostructured layer bonded onto silicon, measured without sample preparation. Our approach takes advantages of 3D x-ray Bragg ptychography combined to an optimized inversion process. The excellent agreement with the sample nominal structure validates the reconstruction while the evidence of spatial fluctuations hardly observable by other means, underlines the specificities of Bragg ptychography.