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4. Challenges in Root Cause Analysis of Particle Defects

5. Chemical Characterization of Semiconductor Defects and Particles on the Wafer Surface by Multiple Microanalysis Techniques

6. Main and Satellite Features in the Ni 2p XPS of NiO.

7. Origin of the complex main and satellite features in Fe 2p XPS of Fe 2 O 3 .

8. Combined multiplet theory and experiment for the Fe 2p and 3p XPS of FeO and Fe 2 O 3 .

9. Covalency in Fe 2 O 3 and FeO: Consequences for XPS satellite intensity.

11. Analysis of the Fe 2p XPS for hematite α Fe 2 O 3 : Consequences of covalent bonding and orbital splittings on multiplet splittings.

12. Practical Guides for X-Ray Photoelectron Spectroscopy (XPS): First Steps in planning, conducting and reporting XPS measurements.

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