19 results on '"Brundle CR"'
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2. Surface detective work during development of a multilayer circuit board
3. Chemical Characterization of Semiconductor Defects and Particles on the Wafer Surface by Multiple Microanalysis Techniques.
4. Challenges in Root Cause Analysis of Particle Defects
5. Chemical Characterization of Semiconductor Defects and Particles on the Wafer Surface by Multiple Microanalysis Techniques
6. Main and Satellite Features in the Ni 2p XPS of NiO.
7. Origin of the complex main and satellite features in Fe 2p XPS of Fe 2 O 3 .
8. Combined multiplet theory and experiment for the Fe 2p and 3p XPS of FeO and Fe 2 O 3 .
9. Covalency in Fe 2 O 3 and FeO: Consequences for XPS satellite intensity.
10. Proliferation of Faulty Materials Data Analysis in the Literature.
11. Analysis of the Fe 2p XPS for hematite α Fe 2 O 3 : Consequences of covalent bonding and orbital splittings on multiplet splittings.
12. Practical Guides for X-Ray Photoelectron Spectroscopy (XPS): First Steps in planning, conducting and reporting XPS measurements.
13. Bonding and electronic structure in high-Tc superconducting oxides: A case for the importance of the cations.
14. Reduction of macroscopic moment in ultrathin Fe films as the magnetic orientation changes.
15. Evidence for oxygen-island formation on Al(111): Cluster-model theory and x-ray photoelectron spectroscopy.
16. Origin of the Ba core-level binding-energy difference between tetragonal and orthorhombic YBa2Cu3O7- delta.
17. Spin-dependent electron attenuation by transmission through thin ferromagnetic films.
18. Observation and characterization of a strained lateral superlattice in the oxidation of Ni(001).
19. Spherical-wave effects in photoelectron diffraction.
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