22 results on '"Casanova-González, Óscar"'
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2. New metrology technique for measuring the free shape of a patterned 300mm wafer held vertically
3. New wafer shape measurement technique for 300mm blank vertically held silicon wafer
4. New wavefront phase sensor used for 3D shape measurements of silicon wafers
5. Wave front phase imaging for silicon wafer metrology
6. New high repeatability wafer geometry measurement technique for full 200mm and 300mm blank wafers
7. New metrology technique for measuring the free shape of a patterned 300mm wafer held vertically
8. New wafer shape measurement technique for 300mm blank vertically held silicon wafer
9. New wave front phase sensor used for 3D shape measurements of patterned silicon wafers
10. New wavefront phase sensor used for 3D shape measurements of silicon wafers
11. The optics of the human eye at 8.6 µm lateral resolution
12. New high repeatability wafer geometry measurement technique for full 200mm and 300mm blank wafers
13. New metrology technique for measuring wafer geometry on a full 300mm silicon wafer
14. Privacy-enabled displays.
15. New wafer shape measurement technique for 300mm blank vertically held silicon wafer.
16. Estudio e implementación de esquemas neuro-fuzzy aplicados al procesamiento de variables cinemáticas en el campo del diagnóstico y la navegación inercial
17. New wave front phase sensor used for 3D shape measurements of patterned silicon wafers.
18. New wavefront phase sensor used for 3D shape measurements of silicon wafers.
19. New high repeatability wafer geometry measurement technique for full 200mm and 300mm blank wafers.
20. Wave front phase imaging for silicon wafer metrology
21. New metrology technique for measuring wafer geometry on a full 300mm silicon wafer.
22. Privacy-enabled displays
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