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12 results on '"Cascade Microtech Inc. -- Product information"'

1. Testing MEMS: don't reinvent the wheel but take title on faith. (Design Feature)

Author

Strassberg, Dan

Subjects
Analog Devices Inc. -- Product information, Aseco Corp. -- Product information, Cascade Microtech Inc. -- Product information, Coventor Inc. -- Product information, ENDEVCO Corp. -- Product information, Electronic components industry -- Product information, Business, Electronics and electrical industries
Abstract

MEMS, WHICH NOT ONLY CONDITION SIGNALS BUT ALSO MOVE, REQUIRE CONSUMMATE CARE IN HANDLING. BUT THE MANUFACTURERS HAVE FIGURED OUT MUCH OF WHAT YOU MUST KNOW TO SUCCESSFULLY APPLY THE [...]

Published
2001

2. M150 Measurement Platform

Subjects
Semiconductor industry, Cascade Microtech Inc. -- Product information, Semiconductor industry -- Product information
Abstract

By Staff Cascade Microtech , www.cascademicrotech.com The M150 Measurement Platform provides high-performance and precision electrical-measurement capabilities for any type of 150-mm device on a single platform. This platform has a […]

Published
2006

3. Wafer probes operates to 220 GHz

Subjects
Semiconductor industry, Cascade Microtech Inc. -- Product information, Probes (Electronic instruments) -- Product information, Semiconductor industry -- Product information
Abstract

Staff Cascade Microtech has announced enhancements to its line of Infinity probes, supporting finer pitches (down to 50 microns) and smaller contact areas (with pads as small as 25 x […]

Published
2006

4. Wafer probes enable superior RF characterization of smaller devices

Subjects
Cascade Microtech Inc. -- Product information, Semiconductor industry -- Product information, Probes (Electronic instruments) -- Product information, Semiconductor industry, Electronics and electrical industries, Cascade Microtech Infinity (Electronic test device) -- Product information
Abstract

Shrinking trends in the semiconductor industry is forcing probing pads to be reduced accordingly. Consequently, Cascade Microtech has made significant technological advancements to its popular line of Infinity probes, offering [...]

Published
2006

5. Enterprise software for RF device characterization

Subjects
Cascade Microtech Inc. -- Product information, Software -- Product information, Semiconductor industry -- Product information, Business, Electronics and electrical industries, Engineering and manufacturing industries, Telecommunications industry, Semiconductor industry, Software quality, Product information
Abstract

In today's competitive marketplace the characterization of RF semiconductor devices for modeling, design, applications and process improvement must be faster, more efficient, and more repeatable and accurate as companies strive [...]

Published
2003

6. Probe cards measure DC and RF

Subjects
Cascade Microtech Inc. -- Product information, Semiconductor industry -- Product information, Business, Electronics, Engineering and manufacturing industries, Semiconductor industry, Semiconductor device, Product information
Abstract

Two new Pyramid® Parametric Probe Cards allow single-pass DC and RF measurements during parametric production test for semiconductors with advanced process nodes at 65 nm, 45 nm, and beyond. The [...]

Published
2008

7. Versatile measurement platform allows affordable customer reconfiguration

Author

Novellino, John

Subjects
Semiconductor industry, Cascade Microtech Inc. -- Product information, Cascade Microtech M150 Measurement Platform (Electronic test device) -- Product information, Semiconductor industry -- Product information
Abstract

With test equipment as expensive as it is, flexibility (read: reusability) is important. The M150 Measurement Platform from Cascade Microtech aims to please in that regard, with a variety of […]

Published
2006

8. Semiautomatic probe station. (Product Panorama)

Subjects
Electronic test device, Cascade Microtech Inc. -- Product information, Cascade Microtech S300 (Electronic test device) -- Design and construction, Testing equipment -- Design and construction -- Product information, Instrument industry -- Product information
Abstract

The S300 semiaumatic probe station for 300mm wafers, combined with Agilent Technologies 429A, creates a powerful tool for the design, qualification, quality control, and testing of electronic components. The drive […]

Published
2002

9. Probing system. (product in brief - Inspection)

Subjects
Cascade Microtech Inc. -- Product information, Semiconductor industry -- Product information
Abstract

Cascade's probing solution for edge-emitting laser bars and discrete devices teams new optical fiber probes and large-area photodiodes in conjunction with existing RF and DC probes and probe stations. * […]

Published
2001

10. A thermal probing system

Subjects
Cascade Microtech Inc. -- Product information, Summit 10600 (Test equipment, electronic) -- Evaluation, Optoelectronics industry -- Product information, Business, Electronics and electrical industries, Engineering and manufacturing industries, Telecommunications industry, Evaluation, Product information
Abstract

The Summit 10600 semiautomatic thermal probing system operates over the ambient temperature from -65° to 200°C in an integrated system at frequencies to 65 GHz. The system features the MicroChamber™ [...]

Published
1992

11. Lightwave probe

Subjects
Cascade Microtech Inc. -- Product information, Fiber optics industry -- Product information, Business, Telecommunications industry
Abstract

Lightwave Probe Cascade Microtech Beaverton, OR www.cascademicrotech.com Cascade Microtech's Lightwave Probe is a key part of a complete photonic device characterization solution for on-wafer and in-module devices. Its vertical orientation [...]

Published
2001

12. Photonic device probes

Subjects
Cascade Microtech Inc. -- Product information, Semiconductor industry -- Product information, Business, Telecommunications industry
Abstract

Photonic Device Probes Cascade Microtech Beaverton, OR www.cascademicrotech.com Cascade Microtech introduces two new probe stations optimized for probing photonic devices at the wafer and module level. These stations are compatible [...]

Published
2001

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