92 results on '"Chai Chang-Chun"'
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2. Novel electromechanical coupling theory of GaN HEMT structure under mechanical clamping
3. Mechanism Analysis and Thermal Damage Prediction of High-Power Microwave Radiated CMOS Circuits
4. C band microwave damage characteristics of pseudomorphic high electron mobility transistor*
5. Structure-dependent behavior of stress-induced voiding in Cu interconnects
6. Study on high power microwave nonlinear effects and degradation characteristics of C-band low noise amplifier
7. Mechanism of AlGaAs/InGaAs pHEMT Nonlinear Response Under High-Power Microwave Radiation
8. Damage effects and mechanism of the silicon NPN monolithic composite transistor induced by high-power microwaves
9. Physics-based analysis and simulation model of electromagnetic interference induced soft logic upset in CMOS inverter
10. Physical Properties of C-Si Alloys inC2/mStructure
11. Modeling and understanding of the thermal failure induced by high power microwave in CMOS inverter
12. Investigation on latch-up susceptibility induced by high-power microwave in complementary metal–oxide–semiconductor inverter
13. Influence of pulse parameters on the damage effect of the GaAs PHEMT caused by the repetition pulse
14. Influence of the external condition on the damage process of the GaAs pseudomorphic high electron mobility transistor induced by the electromagnetic pulse
15. Optimization design on breakdown voltage of AlGaN/GaN high-electron mobility transistor
16. Electronic Transport Properties of (7,0) Semiconducting Carbon Nanotube
17. Analysis of the damage threshold of the GaAs pseudomorphic high electron mobility transistor induced by the electromagnetic pulse
18. Damage effect and mechanism of the GaAs high electron mobility transistor induced by high power microwave
19. Damage effect and mechanism of the GaAs pseudomorphic high electron mobility transistor induced by the electromagnetic pulse
20. Damage effects and mechanism of the GaN high electron mobility transistor caused by high electromagnetic pulse
21. The influence of package thermal resistance on the EMP injection damage effect of transistors
22. A package method for reducing bus crosstalk in full chip ESD protection circuit
23. Simulation and experimental study of high power microwave damage effect on AlGaAs/InGaAs pseudomorphic high electron mobility transistor
24. Design of a novel dual pathway ESD protection device using ISE-TCAD
25. Temperature dependence of breakdown in anisotropic 6H-SiC MOSFET
26. Simulation and experimental study of high power microwave damage effect on AlGaAs/InGaAs pseudomorphic high electron mobility transistor
27. Near-zone electromagnetic interference estimation for shielding effectiveness of apertured rectangular enclosure
28. Temperature dependence of latch-up effects in CMOS inverter induced by high power microwave
29. Hardening measures for bipolar transistors against microwave-induced damage
30. The pulsed microwave damage trend of a bipolar transistor as a function of pulse parameters
31. Drain-induced barrier lowering effect for short channel dual material gate 4H silicon carbide metal—semiconductor field-effect transistor
32. Microwave damage susceptibility trend of a bipolar transistor as a function of frequency
33. Motion of current filaments in avalanching PIN diodes
34. A compact model of substrate resistance for deep sub-micron gate grounded NMOS electrostatic discharge protection device
35. The damage effect and mechanism of bipolar transistors induced by injection of electromagnetic pulse from the base
36. Drain-induced barrier lowering effect for short channel dual material gate 4H silicon carbide metal—semiconductor field-effect transistor
37. Effects of microwave pulse-width damage on a bipolar transistor
38. Modeling of the drain-induced barrier lowering effect and optimization for a dual-channel 4H silicon carbide metal semiconductor field effect transistor
39. New 4H silicon carbide metal semiconductor field-effect transistor with a buffer layer between the gate and the channel layer
40. Effects of gate-buffer combined with a p-type spacer structure on silicon carbide metal semiconductor field-effect transistors
41. Target Tracking Approximation Algorithms Based on Particle Filters and near-Linear Curve Simplified Optimization in WSN
42. Quantitatively Exploring the Effect of a Triangular Electrode on Performance Enhancement in a 4H-SiC Metal-Semiconductor-Metal Ultraviolet Photodetector
43. Effect of a gate buffer layer on the performance of a 4H-SiC Schottky barrier field-effect transistor
44. Effects of microwave pulse-width damage on a bipolar transistor
45. Optical coupling optimization in a novel metal—semiconductor—metal ultraviolet photodetector based on semicircular Schottky electrodes
46. Modeling of the drain-induced barrier lowering effect and optimization for a dual-channel 4H silicon carbide metal semiconductor field effect transistor
47. Effects of the improved hetero-material-gate approach on sub-micron silicon carbide metal-semiconductor field-effect transistor
48. Effects of gate-buffer combined with a p-type spacer structure on silicon carbide metal semiconductor field-effect transistors
49. The damage effect and mechanism of the bipolar transistor caused by microwaves
50. Resistometric study on electromigration failure in copper interconnects
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