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This paper analyzes the effect of tier-to-tier thermal and supply crosstalk on the performance and robustness of the static random access memory (SRAM) within a 3-D stack under crosstalk influence of the logic cores. Our framework integrates distributed process variation aware circuit analysis, RC-based thermal simulation, and distributed RLC-based power delivery network simulation. The analysis shows when the logic cores and SRAMs are integrated in 3-D stack, the thermal and supply crosstalk degrade the SRAM performance and noise margin during read and write operations. [ABSTRACT FROM AUTHOR]

This paper estimates the temperature distribution within a spin-torque-transfer RAM (STTRAM) cell due to self-heating using a thermal simulation based on the finite volume method. The analysis shows that, due to high switching current and small volume of the magnetic tunnel junction (MTJ), there can be significant rise in temperature in the MTJ as well as the silicon transistor. The impacts of the increased temperature on operational reliability metrics of the STTRAM cell, i.e., read disturb, write failure, and sensing accuracy, are evaluated. It is shown that, due to the self-heating effect, the operational reliability of an STTRAM cell depends on the read–write history of that cell. [ABSTRACT FROM AUTHOR]