27 results on '"Chen, Kuan-Hsu"'
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2. Dynamic (Sub)surface‐Oxygen Enables Highly Efficient Carbonyl‐Coupling for Electrochemical Carbon Dioxide Reduction
3. Novel metal peroxide nanoboxes restrain Clostridioides difficile infection beyond the bactericidal and sporicidal activity
4. The symptoms of autism including social communication deficits and repetitive and restricted behaviors are associated with different emotional and behavioral problems
5. Utilization and medical costs of outpatient rehabilitation among children with autism spectrum conditions in Taiwan
6. Abnormal Two-Stage Degradation Under Hot Carrier Injection With Lateral Double-Diffused MOS With 0.13-$\mu$m Bipolar-CMOS-DMOS Technology
7. Analysis of Breakdown-Voltage Increase on SiC Junction Barrier Schottky Diode Under Negative Bias Stress
8. Polyphenol-assisted assembly of Au-deposited polylactic acid microneedles for SERS sensing and antibacterial photodynamic therapy
9. Abnormal Threshold Voltage Degradation Under Semi-On State Stress in Si3N4/AlGaN/GaN-HEMT
10. Redox‐Driven Cu─Pd Bond Formation to Enhance the Efficiency for Electroreduction of CO 2 to CO
11. Analysis of the buffer trap-induced kink effect in AlGaN/GaN HEMT on SiC substrate
12. Analysis of abnormal threshold voltage shift induced by surface donor state in GaN HEMT on SiC substrate
13. Abnormal On-Current Degradation Under Non-Conductive Stress in Contact Field Plate Lateral Double-Diffused Metal-Oxide- Semiconductor Transistor With 0.13-μm Bipolar-CMOS-DMOS Technology
14. Investigating two−stage degradation of threshold voltage induced by off−state stress in AlGaN/GaN HEMTs
15. Investigation of degradation mechanism after negative bias temperature stress in Si/SiGe channel metal-oxide-semiconductor capacitors induced by hydrogen diffusion
16. Investigation of degradation behavior under negative bias temperature stress in Si/Si0.8Ge0.2 metal-oxide-semiconductor capacitors
17. Electrical Degradation of In Situ SiN/AlGaN/GaN MIS-HEMTs Caused by Dehydrogenation and Trap Effect Under Hot Carrier Stress
18. Abnormal Threshold Voltage Degradation Under Semi-On State Stress in Si 3 N 4 /AlGaN/GaN-HEMT.
19. Obtaining impact ionization-induced hole current by electrical measurements in gallium nitride metal–insulator–semiconductor high electron mobility transistors
20. Abnormal Two-Stage Degradation Under Hot Carrier Injection With Lateral Double-Diffused MOS With 0.13-μm Bipolar-CMOS-DMOS Technology
21. Reliability enhancement in dipole-doped metal oxide semiconductor capacitor induced by low-temperature and high-pressure nitridation
22. Malingering by proxy presenting with symptoms of posttraumatic stress disorder: A case report of child abuse
23. Advanced Low-Temperature–High-Pressure Hydrogen Treatment for Interface Defect Passivation in Si- and SiGe-Channel MOSCAPs
24. Leakage Current in Fast Recovery Diode Suppressed by Low Temperature Supercritical Fluid Treatment Process
25. Effect of deposition temperature on electrical properties of one-transistor-one-capacitor (1T1C) FeRAM devices
26. Abnormal Increment Substrate Current After Hot Carrier Stress in n-FinFET
27. A Study of Effects of Metal Gate Composition on Performance in Advanced n-MOSFETs
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