22 results on '"Chiaki Morita"'
Search Results
2. An aortic body carcinoma with sarcomatoid morphology and chondroid metaplasia in a French Bulldog
- Author
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Takeshi Izawa, Shunsuke Shimamura, Miyuu Tanaka, Chiaki Morita, Yusuke Wada, Jyoji Yamate, Mitsuru Kuwamura, and Shunsuke Noguchi
- Subjects
Pathology ,medicine.medical_specialty ,medicine.medical_treatment ,biology.animal_breed ,H&E stain ,French bulldog ,Dogs ,Fatal Outcome ,Metaplasia ,Ascites ,Carcinoma ,Medicine ,Animals ,Dog Diseases ,Paraganglioma, Extra-Adrenal ,aortic body carcinoma ,General Veterinary ,biology ,business.industry ,Cartilage ,sarcomatous transformation ,Sarcoma ,medicine.disease ,Aortic Bodies ,Note ,Radiation therapy ,medicine.anatomical_structure ,dog ,Female ,medicine.symptom ,business ,Aortic body - Abstract
An 11-year-old female French Bulldog was presented with a mass at the base of the heart, detected by X-ray and echocardiography. Clinical abnormality included abdominal retention by ascites. Radiation therapy was performed for 5 weeks. The mass volume didn't change during the radiotherapy. The condition became worse and the dog died 6 months after the initial presentation and necropsy was performed. Grossly, the mass, 12.5 × 6.5 × 6.0 cm in size, was found at the base of the heart. Histopathological examination revealed that cardiac mass was composed of alveolar, bundle and diffuse proliferation of neoplastic cells. Most of the neoplastic cells showed a spindle morphology; in some areas small round or polyhedral neoplastic cells were observed. Occasional cartilage metaplasia was seen multifocal in the mass, and it was surrounded by the sarcomatoid proliferation. Electron microscopy revealed a few neuroendocrine granules in the cytoplasm of spindle and polyhedral neoplastic cells. Metastatic cells in the lungs which had not irradiated demonstrated typical morphology of aortic body tumors. Based on these findings, the case was diagnosed as an aortic body carcinoma with sarcomatoid morphology and chondroid metaplasia.
- Published
- 2020
3. Large Scale Objects Recognition by using GIFTS Image Feature and its Evaluation in Practical use
- Author
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Hiroki Nakano, Chiaki Morita, Yumi Mori, and Shingo Nagai
- Subjects
Scale (ratio) ,Feature (computer vision) ,Computer science ,business.industry ,Mechanical Engineering ,Pattern recognition ,Artificial intelligence ,business ,Image (mathematics) - Published
- 2015
- Full Text
- View/download PDF
4. A simple way to obtain backscattered electron images in a scanning transmission electron microscope
- Author
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Shigeyasu Tanaka, Hiroki Tsuruta, Takayoshi Tanji, and Chiaki Morita
- Subjects
Conventional transmission electron microscope ,Microscope ,Materials science ,Physics::Instrumentation and Detectors ,business.industry ,Scanning confocal electron microscopy ,law.invention ,Optics ,Annular dark-field imaging ,Electron tomography ,Structural Biology ,law ,Scanning transmission electron microscopy ,Energy filtered transmission electron microscopy ,High Energy Physics::Experiment ,Radiology, Nuclear Medicine and imaging ,Electron beam-induced deposition ,business ,Instrumentation - Abstract
We have fabricated a simple detector for backscattered electrons (BSEs) and incorporated the detector into a scanning transmission electron microscope (STEM) sample holder. Our detector was made from a 4-mm(2) Si chip. The fabrication procedure was easy, and similar to a standard transmission electron microscopy (TEM) sample thinning process based on ion milling. A TEM grid containing particle objects was fixed to the detector with a silver paste. Observations were carried out using samples of Au and latex particles at 75 and 200 kV. Such a detector provides an easy way to obtain BSE images in an STEM.
- Published
- 2014
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5. An aortic body carcinoma with sarcomatoid morphology and chondroid metaplasia in a French Bulldog.
- Author
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Chiaki MORITA, Miyuu TANAKA, Shunsuke NOGUCHI, Shunsuke SHIMAMURA, Yusuke WADA, Takeshi IZAWA, Jyoji YAMATE, and Mitsuru KUWAMURA
- Subjects
METAPLASIA ,BULLDOG ,CARCINOMA ,MORPHOLOGY ,ELECTRON microscopy ,CELL proliferation - Abstract
An 11-year-old female French Bulldog was presented with a mass at the base of the heart, detected by X-ray and echocardiography. Clinical abnormality included abdominal retention by ascites. Radiation therapy was performed for 5 weeks. The mass volume didn't change during the radiotherapy. The condition became worse and the dog died 6 months after the initial presentation and necropsy was performed. Grossly, the mass, 12.5 × 6.5 × 6.0 cm in size, was found at the base of the heart. Histopathological examination revealed that cardiac mass was composed of alveolar, bundle and diffuse proliferation of neoplastic cells. Most of the neoplastic cells showed a spindle morphology; in some areas small round or polyhedral neoplastic cells were observed. Occasional cartilage metaplasia was seen multifocal in the mass, and it was surrounded by the sarcomatoid proliferation. Electron microscopy revealed a few neuroendocrine granules in the cytoplasm of spindle and polyhedral neoplastic cells. Metastatic cells in the lungs which had not irradiated demonstrated typical morphology of aortic body tumors. Based on these findings, the case was diagnosed as an aortic body carcinoma with sarcomatoid morphology and chondroid metaplasia. [ABSTRACT FROM AUTHOR]
- Published
- 2020
- Full Text
- View/download PDF
6. Levels, Temporal Trends, and Tissue Distribution of Perfluorinated Surfactants in Freshwater Fish from Asian Countries
- Author
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Mahua Saha, Nozomi Adachi, Chiaki Morita, Michio Murakami, and Hideshige Takada
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Asia ,Health, Toxicology and Mutagenesis ,Food Contamination ,Kidney ,Toxicology ,Snakehead ,Surface-Active Agents ,chemistry.chemical_compound ,Tandem Mass Spectrometry ,Animals ,Ecotoxicology ,Tissue Distribution ,Tissue distribution ,Muscle, Skeletal ,Carp ,Developing Countries ,Chromatography, High Pressure Liquid ,Fluorocarbons ,biology ,Chemistry ,Ovary ,Fishes ,General Medicine ,biology.organism_classification ,Pollution ,Perfluorooctane ,Alkanesulfonic Acids ,Liver ,Environmental chemistry ,Freshwater fish ,Female ,Water Pollutants, Chemical ,Environmental Monitoring ,Food contaminant ,Catfish - Abstract
Perfluorinated surfactants (PFSs) in Asian freshwater fish species were analyzed to investigate tissue distribution, temporal trends, extent of pollution, and level of PFS exposure through food intake. Freshwater fish species, namely carp, snakehead, and catfish, were collected in Japan, Vietnam, India, Malaysia, and Thailand, and 10 PFSs, including perfluorooctanesulfonate (PFOS) and perfluorooctanoate, were analyzed by liquid chromatography–tandem mass spectrometry. PFSs in carp in Tokyo were more concentrated in kidneys (Σ10 PFSs = 257 ± 95 ng/g wet weight [ww]) and livers (119 ± 36 ng/g ww) than in ovaries (43 ± 2 ng/g ww) and muscles (24 ± 17 ng/g ww). Concentrations of PFOS and its precursor, perfluorooctane sulfonamide, in livers of carp and in waters in Tokyo showed a dramatic decrease during the last decade, probably because of 3 M’s phasing-out of the manufacture of perfluorooctanesulfonyl-fluoride-based products in 2000. In contrast, continuing contamination by long-chain perfluorocarboxylates (PFCAs) with ≥ 9 fluorinated carbons was seen in multiple media, suggesting that these compounds continue to be emitted. PFS concentrations in freshwater fish species in tropical Asian countries were generally lower than those in developed countries, such as Japan, e.g., for PFOS in muscle, Vietnam < 0.05–0.3 ng/g ww; India < 0.05–0.2 ng/g ww; Malaysia < 0.05–0.2 ng/g ww; Thailand < 0.05 ng/g ww; and Japan (Tokyo) = 5.1–22 ng/g ww. Daily intake of short-chain PFCAs with ≤ 8 fluorinated carbons from freshwater fish species in Japan was approximately one order of magnitude lower than that from drinking water, whereas daily intake of PFOS and long-chain PFCAs with ≥ 9 fluorinated carbons from freshwater fish species was comparable with or greater than that from drinking water. Because the risk posed by exposure to these compounds through intake of fish species is a matter of concern, we recommend the continued monitoring of PFS levels in Asian developing countries.
- Published
- 2011
- Full Text
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7. Measurement of electric field distribution using a conventional transmission electron microscope
- Author
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Hiroshi Shimoyama, Hidekazu Murata, Kotaro Kuroda, Chiaki Morita, Hiroto Mori, Nobuyuki Tanaka, and Katsuhiro Sasaki
- Subjects
Conventional transmission electron microscope ,Scanning Hall probe microscope ,Materials science ,Optics ,Field (physics) ,Electron tomography ,business.industry ,Aperture ,Electric field ,Scanning transmission electron microscopy ,Low-voltage electron microscope ,business ,Instrumentation - Abstract
A simple and quick method to measure the electric field distribution near a specimen using a conventional transmission electron microscope has been developed. The electric field distribution around a field emitter needle was measured to evaluate the performance of the method. It was found that this method allows us to measure the 2D distribution of electric field quantitatively with error of
- Published
- 2010
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8. Development of remote control and monitoring system for the FE gun in HVEM
- Author
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Kyoichi Miyauchi, Hiroshi Shimoyama, Yoshio Enomoto, Shigeo Arai, and Chiaki Morita
- Subjects
Materials science ,Microscope ,business.industry ,Insulator (electricity) ,law.invention ,Field electron emission ,Optics ,law ,Transmission electron microscopy ,Electron microscope ,business ,Field emission gun ,Instrumentation ,High voltage electron microscopy ,Voltage - Abstract
This paper describes a control and monitoring system for the field emission (FE) gun in the high-voltage electron microscope (HVEM), where the whole FE gun system is located inside a pressure vessel and is floated on a high voltage of 1 MV. The operating condition of the FE gun system is controlled and monitored mainly by a bi-directional communication system between ground and high potential through optical fibres. A mechanical driving system by combination of insulator rods and stepping motors is partially used as a control system for FE gun operation. The monitoring system developed here also functions as a safety circuit that detects abnormal situations, such as an abnormal deterioration of vacuum, and protects the FE tip against fatal damage. The fundamental performance of the microscope has been tested for transmission electron microscope (TEM) and scanning TEM operation modes.
- Published
- 2003
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9. Development of battery charging system for the FE gun system of HVEM
- Author
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Hiroshi Shimoyama, Kyoichi Miyauchi, Toshio Onai, Chiaki Morita, and Shigeo Arai
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Battery (electricity) ,Materials science ,Maximum power principle ,business.industry ,Condenser (optics) ,Electrical engineering ,High voltage ,Electric power transmission ,Forensic engineering ,business ,Field emission gun ,Instrumentation ,High voltage electron microscopy ,Electronic circuit - Abstract
We have developed a reliable and efficient battery-charging system for the field emission (FE) gun system of high voltage electron microscopes, where the operating condition of the whole FE gun system can be controlled and monitored through a bi-directional optical fiber system, and the control and monitoring circuits located on the high potential of 1 MV are driven by rechargeable Ni-Cd batteries. The power transmission from ground to the high potential is performed through filter condenser circuit. Under the condition that the filter condenser current is limited to 0.2 A(rms) (root-mean-square value), it is possible to transmit the maximum power as high as 65 W, which is enough for the daily operation of the FE gun system. The charging circuit has a function of protecting the batteries from over-charging.
- Published
- 2000
- Full Text
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10. Optimization of Operating Conditions for the FE Gun System of HVEM
- Author
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Chiaki Morita, Hiroshi Shimoyama, and Toshimi Ohye
- Subjects
Physics ,Optics ,business.industry ,business ,Field emission gun ,Instrumentation ,High voltage electron microscopy ,Electrostatic lens - Published
- 1996
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11. Optimization of the operating condition of the accelerating tube for the high voltage electron microscope equipped with the field emission gun
- Author
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Chiaki Morita, Toshimi Ohye, and Hiroshi Shimoyama
- Subjects
Physics ,Nuclear and High Energy Physics ,Field (physics) ,business.industry ,Electron ,law.invention ,Lens (optics) ,Optics ,law ,Electrode ,Tube (fluid conveyance) ,Field emission gun ,business ,Instrumentation ,High voltage electron microscopy ,Beam (structure) - Abstract
Numerical calculations have been conducted on the electron optical characteristics of the accelerating tube (AT) for the high voltage electron microscope (HVEM) equipped with the field emission gun (FEG). The emitted electrons are firstly accelerated to V0 by the FEG and finally to Va by the AT which consists of 34 stages of accelerating electrodes with an inner diameter of 33 mm and has an overall length of 1423 mm. The AT is treated as a thick electrostatic accelerating lens. Several electron optical problems arising from a combination of the AT with the FEG are studied. In order to reduce an unfavorable aberration effect of the AT-lens, the beam crossover must be brought to a position near the entrance plane of the AT. This can be done by a transfer lens which is placed between the FEG and the AT. The introduction of a partial retarding field in the AT is also very effective for a flexible operation of the FEG system without serious aberration effects of the AT-lens.
- Published
- 1995
- Full Text
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12. Mapping of minority carrier lifetime distributions in multicrystalline silicon using transient electron-beam-induced current
- Author
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Takayoshi Tanji, Yoshio Ohshita, Shigeyasu Tanaka, Takuya Kushida, and Chiaki Morita
- Subjects
Transients and Migrants ,Materials science ,Silicon ,business.industry ,Electron beam-induced current ,Silicon Compounds ,chemistry.chemical_element ,Electrons ,Carrier lifetime ,Models, Theoretical ,chemistry ,Scanning transmission electron microscopy ,Cathode ray ,Microscopy, Electron, Scanning ,Optoelectronics ,Wafer ,Transient (oscillation) ,Current (fluid) ,business ,Instrumentation - Abstract
We have used transient electron-beam-induced current (EBIC) to map minority carrier lifetime distributions in multicrystalline Silicon (mc-Si). In this technique, the electron beam from a scanning transmission electron microscope was on-off modulated while the sample was scanned. The resulting transient EBIC was analyzed to form a lifetime map. An analytical function was introduced as part of the analysis in determining this map. We have verified this approach using numerical simulations and have reproduced a lifetime map for an mc-Si wafer.
- Published
- 2012
13. Development and application of intermittent electron irradiation technique with a high voltage electron microscope
- Author
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Chiaki Morita, Shigeo Arai, Michio Kiritani, and N. Yokoi
- Subjects
Materials science ,Reflection high-energy electron diffraction ,business.industry ,Scanning electron microscope ,law.invention ,law ,Electron beam processing ,Optoelectronics ,Energy filtered transmission electron microscopy ,Atomic physics ,Electron microscope ,Electron beam-induced deposition ,business ,Instrumentation ,Environmental scanning electron microscope ,High voltage electron microscopy - Published
- 1993
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14. Convergent-beam electron diffraction in the high-voltage electron microscope with continuously variable reference voltage for lenses and alignments
- Author
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K. Kuroda, Shigeo Arai, Chiaki Morita, Hiroyasu Saka, and N. Yokoi
- Subjects
Conventional transmission electron microscope ,Materials science ,business.industry ,Condensed Matter::Mesoscopic Systems and Quantum Hall Effect ,Acceleration voltage ,Atomic and Molecular Physics, and Optics ,Electronic, Optical and Magnetic Materials ,law.invention ,Optics ,Electron diffraction ,law ,Scanning transmission electron microscopy ,Electron microscope ,business ,Instrumentation ,High voltage electron microscopy ,Voltage reference ,Voltage - Abstract
A device which provides a continuously variable reference voltage for lenses and alignments is developed for the high-voltage scanning transmission electron microscope H-1250ST. When continuously varying the operating voltage, compensation for all lenses and alignments is easily performed by the adoption of the device. The device is especially useful for forming the convergent-beam electron diffraction (CBED) patterns at any accelerating voltage. The performance of the device is demonstrated by observing the CBED patterns. Large-angle CBED patterns are taken for Si- and Y-based high- T c superconductors at various voltages. Systematic critical voltages of Y-based high- T c superconductors are measured for the 400 and 220 reflections.
- Published
- 1991
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15. Localized electron irradiation methods and their application to detection of flow-field of point defects
- Author
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Michio Kiritani, Yuhki Satoh, Kazuto Arakawa, Chiaki Morita, and Shigeo Arai
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Materials science ,business.industry ,Economies of agglomeration ,Temperature ,Crystallographic defect ,Molecular physics ,Flow field ,Microscopy, Electron ,Optics ,Scanning transmission electron microscopy ,Electron beam processing ,Outflow ,business ,Instrumentation ,Copper ,Production rate - Abstract
We propose new techniques of electron irradiation for studying the kinetics of simple point defects and their agglomeration, by making the most use of the intrinsic function of an ultrahigh-voltage scanning transmission electron microscope. The methods enable us to realize a very high defect production rate at a localized area and create a spot or band-shape source of point defects. The present methods were applied to an attempt to detect the point defects flowing out of a very localized area, examining the growth and shrinkage of pre-introduced interstitial clusters. At low temperatures where vacancies are immobile, outflow of the interstitials was observed. In contrast, at an elevated temperature where vacancies are mobile, outflow of the vacancies seemed to play a dominant role in the apparent secondary defect reactions. A possible explanation to aid understanding of the present results is proposed.
- Published
- 2004
16. Dependence of Aberration Coefficients of Triode Field Emission Gun on Electrode Geometries for Accelerating and Decelerating Modes
- Author
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Toshimi Ohye, Chiaki Morita, and Hiroshi Shimoyama
- Subjects
Physics ,Optics ,Triode ,law ,business.industry ,Electrode ,Field emission gun ,business ,Instrumentation ,law.invention - Published
- 1995
- Full Text
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17. Improvement and Application of Intermittent Electron Irradiation Technique with a High Voltage Electron Microscope
- Author
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Shigeo Arai, Michio Kiritani, Chiaki Morita, and Kazuto Arakawa
- Subjects
Self-diffusion ,Materials science ,law ,business.industry ,Analytical chemistry ,Electron beam processing ,Optoelectronics ,Electron microscope ,business ,Instrumentation ,law.invention ,Voltage - Published
- 1995
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18. Source analysis of perfluorocarboxylates in Tokyo Bay during dry weather and wet weather using sewage markers
- Author
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Michio Murakami, Takuya Morimoto, A Chiaki Morita, and Hideshige Takada
- Subjects
Hydrology ,Chemistry ,business.industry ,Fluorescence spectrometry ,Sewage ,Context (language use) ,Wastewater ,Geochemistry and Petrology ,Chemistry (miscellaneous) ,Environmental chemistry ,Environmental Chemistry ,Combined sewer ,business ,Surface runoff ,Effluent ,Bay - Abstract
Environmental contextAs perfluorocarboxylates can be carried by surface runoff to waters and cause adverse effects to aquatic organisms, we evaluated the contributions of wastewater and surface runoff to the concentrations of these compounds in Tokyo Bay during dry and wet weather. Sewage markers revealed that the surface runoff was a significant source of perfluorocarboxylates in the bay during wet weather. This finding leads to a greater understanding of sources and pathways of perfluorocarboxylates in waters. AbstractWe investigated the occurrence of perfluorocarboxylates (PFCAs) in Tokyo Bay during dry and wet weather and evaluated the contributions of wastewater effluent, untreated wastewater, and surface runoff by using two sewage markers, caffeine and crotamiton. ∑8PFCAs ranged from 11 to 185 ng L–1. Perfluorononanoate (PFNA) was the major species, followed by perfluorooctanoate (PFOA) and perfluoroheptanoate (PFHpA). Principal component analysis followed by multiple linear regression revealed that the PFCAs were derived mainly from wastewater effluent during dry weather, and jointly from wastewater effluent (59%) and combined sewer overflow (41%) during wet weather. We used caffeine-to-crotamiton ratios to evaluate the contributions of untreated wastewater and wastewater effluent. Estimated concentrations of wastewater-derived PFCAs were much lower than observed concentrations during wet weather, indicating the contribution of surface runoff to contamination. During a combined sewer overflow, surface runoff had a significant effect on contamination in the bay.
- Published
- 2011
- Full Text
- View/download PDF
19. Computer simulation of electron optical characteristics of accelerating tube for high-voltage electron microscope
- Author
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Hiroshi Shimoyama, Toshimi Ohye, and Chiaki Morita
- Subjects
Physics ,Reflection high-energy electron diffraction ,Scanning electron microscope ,business.industry ,Thermionic emission ,law.invention ,Lens (optics) ,Field electron emission ,Optics ,law ,Electron microscope ,business ,High voltage electron microscopy ,Electrostatic lens - Abstract
Numerical calculations were conducted on the electron optical characteristics of the accelerating tube (AT) for the high voltage electron microscope. The emitted electrons are firstly accelerated to V0 by the TE gun or the FE gun and finally to Va by the AT which consists of 34 electrodes with the inner diameter of 33 mm and has the overall length of 1423 mm. The AT is treated as a thick electrostatic accelerating lens. Several electron optical problems arising from a combination of the AT with a thermionic emission (TE) gun or a field emission (FE) gun are studied. For the TE gun the aberration effect of the AT lens is found to be safely neglected for any combination of Va and V0. In the case of the FE gun, on the other hand, the aberration effect of the AT lens can not be neglected and deteriorates the brightness of the beam. This situation can be overcome by placing an electron lens between the FE gun and the AT.© (1993) COPYRIGHT SPIE--The International Society for Optical Engineering. Downloading of the abstract is permitted for personal use only.
- Published
- 1993
- Full Text
- View/download PDF
20. Aberrations of Accelerating Tube for High-Voltage Electron Microscope
- Author
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Toshimi Ohye, Yoshiki Uchikawa, Chiaki Morita, and Hiroshi Shimoyama
- Subjects
Materials science ,Optics ,business.industry ,Tube (fluid conveyance) ,General Medicine ,business ,High voltage electron microscopy - Abstract
The accelerating tube (AT) which accelerates electrons up to a desired energy also functions as an electrostatic lens, In the present paper, numerical calculations were conducted on the electron optical characteristics including the spherical aberration of the AT for the high voltage electron microscope. Several electron optical problems arising from a combination of the AT with a thermionic electron gun (TEG) or a field emission gun (FEG) were studied. The AT consists of 34 electrodes with the inner diameter of 3.3 cm and has the overall length of 142.3 cm (Fig.l). The voltage Va is applied between the cathode and the final electrode of the AT. The initial energy of the electron incident to the AT is eVo, where Vo is the anode voltage of the electron gun mounted on the AT. The electric field inside the AT was calculated using the surface charge method. The ray tracing was carried out on the basis of the relativistic paraxial ray equation, and the cardinal elements of the AT lens were obtained.
- Published
- 1990
- Full Text
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21. Mapping of minority carrier lifetime distributions in multicrystalline silicon using transient electron-beam-induced current.
- Author
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Takuya Kushida, Shigeyasu Tanaka, Chiaki Morita, Takayoshi Tanji, and Yoshio Ohshita
- Subjects
ELECTRON beams ,SCANNING transmission electron microscopy ,COMPUTER simulation ,ELECTRON beam induced current ,SILICON wafers - Abstract
We have used transient electron-beam-induced current (EBIC) to map minority carrier lifetime distributions in multicrystalline Silicon (mc-Si). In this technique, the electron beam from a scanning transmission electron microscope was on-off modulated while the sample was scanned. The resulting transient EBIC was analyzed to form a lifetime map. An analytical function was introduced as part of the analysis in determining this map. We have verified this approach using numerical simulations and have reproduced a lifetime map for an mc-Si wafer. [ABSTRACT FROM AUTHOR]
- Published
- 2012
- Full Text
- View/download PDF
22. Localized electron irradiation methods and their application to detection of flow-field of point defects.
- Author
-
Shigeo Arai, Yuhki Satoh, Kazuto Arakawa, Chiaki Morita, and Michio Kiritani
- Abstract
We propose new techniques of electron irradiation for studying the kinetics of simple point defects and their agglomeration, by making the most use of the intrinsic function of an ultrahigh-voltage scanning transmission electron microscope. The methods enable us to realize a very high defect production rate at a localized area and create a spot or band-shape source of point defects. The present methods were applied to an attempt to detect the point defects flowing out of a very localized area, examining the growth and shrinkage of pre-introduced interstitial clusters. At low temperatures where vacancies are immobile, outflow of the interstitials was observed. In contrast, at an elevated temperature where vacancies are mobile, outflow of the vacancies seemed to play a dominant role in the apparent secondary defect reactions. A possible explanation to aid understanding of the present results is proposed. [ABSTRACT FROM AUTHOR]
- Published
- 2004
- Full Text
- View/download PDF
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