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1. An accurate and efficient high frequency noise simulation technique for deep submicron MOSFETs

Author

Goo, Jung-Suk, Choi, Chang-Hoo, Danneville, Francois, Morifuji, Eiji, Momose, Hisayo Sasaki, Yu, Zhiping, Iwai, Hiroshi, Lee, Thomas H., and Dutton, Robert W.

Subjects
Metal oxide semiconductor field effect transistors -- Models, Business, Electronics, Electronics and electrical industries
Abstract

A simulation method for high frequency noise performance of MOSFETs is presented.

Published
2000

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