7 results on '"Chollet, Frederic"'
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2. Atomic Force Microscopy Investigation of Tensile-Stressed Silicon Grown by Rapid Thermal Chemical Vapour Deposition on Si0.68Ge0.32Relaxed Pseudo-substrates
3. Atomic force microscope images of silica carbogel
4. Roughness Assessment of Polysilicon Using Power Spectral Density
5. Atomic Force Microscopy and Infrared Spectroscopy Studies of Hydrogen Baked Si Surfaces
6. Micro-optomechanical devices: an electrostatically actuated bending waveguide for optical coupling.
7. Atomic force microscope images of silica carbogel.
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