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10. A Highly Reliable Cu Interconnect Technology for Memory Device

17. The Effect of Iridium Bottom Electrode on the Characteristics of Pb(Zr,Ti)O4 Films Grown by MOCVD Method.

19. Fabrication of body-tied FinFETs (Omega MOSFETs) using bulk Si wafers

20. Highly manufacturable sub-100 nm DRAM integrated with full functionality

22. The effects of TaN thickness and strained substrate on the performance and PBTI characteristics of poly-Si/TaN/HfSiON MOSFETs

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