1. A sensitivity analysis of the updated optical design for EUVST on the Solar-C mission
- Author
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Hirohisa Hara, Luca Teriaca, Harry P. Warren, Yoshinori Suematsu, Yukio Katsukawa, Kiyoshi Ichimoto, Toshifumi Shimizu, Tomoko Kawate, Shinsuke Imada, Toshihiro Tsuzuki, Frédéric Auchère, Tomoya Hattori, Charles M. Brown, Shota Narasaki, and Clarence M. Korendyke
- Subjects
Physics ,Spectrometer ,business.industry ,Detector ,Physics::Optics ,Field of view ,Grating ,law.invention ,Telescope ,Wavelength ,Optics ,law ,business ,Image resolution ,Zemax - Abstract
The EUV high-throughput spectroscopic telescope (EUVST) onboard the Solar-C mission has the high spatial (0.4′′) resolution over a wide wavelength range in the vacuum ultraviolet. To achieve high spatial resolution under a design constraint given by the JAXA Epsilon launch vehicle, we further update the optical design to secure margins needed to realize 0.4′′ spatial resolution over a field of view of 100′′×100′′. To estimate the error budgets of spatial and spectral resolutions due to installation and fabrication errors, we perform a sensitivity analysis for the position and orientation of each optical element and for the grating parameters by ray tracing with the Zemax software. We obtain point spread functions (PSF) for rays from 9 fields and at 9 wavelengths on each detector by changing each parameter slightly. A full width at half maximum (FWHM) of the PSF is derived at each field and wavelength position as a function of the perturbation of each optical parameter. Assuming a mount system of each optical element and an error of each optical parameter, we estimate spatial and spectral resolutions by taking installation and fabrication errors into account. The results of the sensitivity analysis suggest that budgets of the total of optical design and the assembly errors account for 15% and 5.8% of our budgets of the spatial resolution in the long wavelength and short wavelength bands, respectively. On the other hand, the grating fabrication errors give a large degradation of spatial and spectral resolutions, and investigations of compensators are needed to relax the fabrication tolerance of the grating surface parameters.
- Published
- 2020
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