1. X-ray Back-Diffraction Profiles with an Si (111) Plate
- Author
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Carlos Giles, Irineu Mazzaro, Hélio C. N. Tolentino, D. Udron, and Cesar Cusatis
- Subjects
Diffraction ,Silicon ,business.industry ,X-ray ,chemistry.chemical_element ,law.invention ,Crystal ,Full width at half maximum ,Reflection (mathematics) ,Optics ,chemistry ,Structural Biology ,law ,business ,Beam (structure) ,Monochromator - Abstract
A two- and, alternatively, a four-crystal monochromator were used for simultaneous measurements of the profiles backward (h) and forward (o) diffracted by a thin Si (111) crystal plate for diffraction angles up to exactly 90 ° at DCI-LURE (Orsay). It is shown that the set-up with a four-crystal monochromator allows the characterization of the back-diffraction region for any crystal plate reflection. Asymmetry and full width at half-maximum (FWHM) of the experimental backwarddiffraction profiles are analyzed. Possible simultaneous diffractions occurring near 90 ° incidence, giving extra peaks in the forward-diffracted profiles, are studied. The good contrast of the o-beam profiles suggests that the back-diffracted o beam could be used as a highly monochromatic beam.
- Published
- 1996
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