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The tunability of superconducting magic-angle twisted-layer graphene films elevates this material system to a promising candidate for superconducting electronics. We implement a gate-tuned Josephson junction in a magic-angle twisted four-layer graphene film. Field-dependent measurements of the critical current show a Fraunhofer-like pattern that differs from the standard pattern with characteristics typical for a weak transverse screener. We observe sudden shifts associated with vortices jumping into and out of the leads. By tuning the leads to the edge of the superconducting dome, we observe fast switching between superconducting and normal states, an effect associated with vortex dynamics. Time-dependent measurements provide us with the vortex energy scale and an estimate for the London penetration depth, in agreement with recent kinetic inductance measurements on twisted graphene films. Our results prove the utility of our junction as a sensor for vortex detection, allowing us to extract fundamental properties of the 2D superconductor., Comment: 21 pages, 4 figures

Magic-Angle Twisted Bilayer Graphene shows a wide range of correlated phases which are electrostatically tunable. Despite a growing knowledge of the material, there is yet no consensus on the microscopic mechanisms driving its superconducting phase. In particular, elucidating the symmetry and formation mechanism of the superconducting phase may provide key insights for the understanding of unconventional, strongly coupled and topological superconductivity. A major obstacle to progress in this direction is that key thermodynamic properties, such as specific heat, electron-phonon coupling and superfluid stiffness, are extremely challenging to measure due to the 2D nature of the material and its relatively low energy scales. Here, we use a gate-defined, radio frequency-biased, Josephson junction to probe the electronic dynamics of magic-angle twisted bilayer graphene (MATBG). We reveal both the electronic quasiparticle dynamics, driven by their thermalization through phonon scattering, as well as the condensate dynamics, driven by the inertia of Cooper pairs. From these properties we recover the evolution of thermalization rates, and the superfluid stiffness across the phase diagram. Our findings favor an anisotropic or nodal pairing state and allow to estimate the strength of electron-phonon coupling. These results contribute to understanding the underlying mechanisms of superconductivity in MATBG while establishing an easy-to-implement method for characterizing thermal and superfluid properties of superconducting 2D materials., Comment: 9 pages, 5 figures

A detailed understanding of the material properties that affect the splitting between the two low-lying valley states in Si/SiGe heterostructures will be increasingly important as the number of spin qubits is increased. Scanning gate microscopy has been proposed as a method to measure the spatial variation of the valley splitting as a tip-induced dot is moved around in the plane of the Si quantum well. We develop a simulation using an electrostatic model of the scanning gate microscope tip and the overlapping gate structure combined with an approximate solution to the three-dimensional Schr\"odinger-Poisson equation in the device stack. Using this simulation, we show that a tip-induced quantum dot formed near source and drain electrodes can be adiabatically moved to a region far from the gate electrodes. We argue that by spatially translating the tip-induced dot across a defect in the Si/SiGe interface, changes in valley splitting can be detected.

We demonstrate dispersive charge sensing of Si/SiGe single and double quantum dots (DQD) by coupling sub-micron floating gates to a radio frequency reflectometry (rf-reflectometry) circuit using the tip of an atomic force microscope (AFM). Charge stability diagrams are obtained in the phase response of the reflected rf signal. We demonstrate single-electron dot-to-lead and dot-to-dot charge transitions with a signal-to-noise ratio (SNR) of 2 and integration time of $\tau~=~2.7~\mathrm{ms}$ and $\tau~=~6.4~\mathrm{ms}$, respectively. The charge sensing SNR compares favorably with results obtained on conventional devices. Moreover, the small size of the floating gates largely eliminates the coupling to parasitic charge traps that can complicate the interpretation of the dispersive charge sensing data.

We use the tip of an atomic force microscope (AFM) to charge floating metallic gates defined on the surface of a Si/SiGe heterostructure. The AFM tip serves as an ideal and movable cryogenic switch, allowing us to bias a floating gate to a specific voltage and then lock the charge on the gate by withdrawing the tip. Biasing with an AFM tip allows us to reduce the size of a quantum dot floating gate electrode down to $\sim100~\mathrm{nm}$. Measurements of the conductance through a quantum dot formed beneath the floating gate indicate that its charge changes in discrete steps. From the statistics of the single-electron leakage events, we determine the floating gate leakage resistance $R \sim 10^{19}~ \mathrm{Ohm}$ - a value immeasurable by conventional means.

Conventional quantum transport methods can provide quantitative information on spin, orbital, and valley states in quantum dots, but often lack spatial resolution. Scanning tunneling microscopy, on the other hand, provides exquisite spatial resolution of the local electronic density of states, but often at the expense of speed. Working to combine the spatial resolution and energy sensitivity of scanning probe microscopy with the speed of microwave measurements, we couple a metallic probe tip to a Si/SiGe double quantum dot that is integrated with a local charge detector. We first demonstrate that a dc-biased tip can be used to change the charge occupancy of the double dot. We then apply microwave excitation through the scanning tip to drive photon-assisted tunneling transitions in the double dot. We infer the double dot energy level diagram from the frequency and detuning dependence of the photon-assisted tunneling resonance condition. These measurements allow us to resolve $\sim$65 $\mu$eV excited states, an energy scale consistent with typical valley splittings in Si/SiGe. Future extensions of this approach may allow spatial mapping of the valley splitting in Si devices, which is of fundamental importance for spin-based quantum processors.

Silicon can be isotopically enriched, allowing for the fabrication of highly coherent semiconductor spin qubits. However, the conduction band of bulk Si exhibits a six-fold valley degeneracy, which may adversely impact the performance of silicon quantum devices. To date, the spatial characterization of valley states in Si remains limited. Moreover, techniques for probing valley states in functional electronic devices are needed. We describe here a cryogen-free scanning gate microscope for the characterization of Si/Si$_{0.7}$Ge$_{0.3}$ quantum devices at mK temperatures. The microscope is based on the Pan-walker design, with coarse positioning piezo stacks and a fine scanning piezo tube. A tungsten microscope tip is attached to a tuning fork for active control of the tip-to-sample distance. To reduce vibration noise from the pulse tube cooler, we utilize both active and passive vibration isolation mechanisms, and achieve a root-mean-square noise in $z$ of $\sim$ 2 nm. Our microscope is designed to characterize fully functioning Si/Si$_{0.7}$Ge$_{0.3}$ quantum devices. As a proof of concept, we use the microscope to manipulate the charge occupation of a Si quantum dot, opening up a range of possibilities for the exploration of quantum devices and materials.