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2. Determining the effective number of bits of high resolution digitizers

Author

Simoes, J. Basilio, Loureiro, Custodio F.M., Landeck, Jorge, and Correia, Carlos M.B.A.

Subjects
Digitizers -- Testing, Analog to digital converters -- Testing, Nuclear research -- Equipment and supplies, Business, Electronics, Electronics and electrical industries
Abstract

A new testing method has been used to evaluate the dynamic performance of several digitizing systems used in nuclear physics experiments. This method is useful for characterizing high resolution analog to digital converters when a pure enough signal source is not available. The signal to noise ratio of the digitizer, excluding the harmonic components from the noise, is the computed parameter. The use of this method to estimate jitter errors is also studied.

Published
1997

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