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This paper proposes analytics for reliability assessment of non‐isolated conventional pulse width modulation DC‐DC (NIDC‐DC) converters. This class of converters consists of conventional Buck, Boost, Buck–Boost, Cuk, Sepic and Zeta topologies. The proposed analytics are founded based on the Markov process principles and can effectively capture the effects of duty cycle, input voltage, output power, voltage gain, components characteristics and aging on the overall reliability performance and mean time to failure of the NIDC‐DC converters. Furthermore, the suggested framework takes both continuous and discontinuous conduction modes of each converter into account, with which the open and short circuit faults in the components are analysed. As an important outcome, the most reliable operation region of the NIDC‐DC converters are obtained with respect to different operational parameters, which is useful in design procedure. Eventually, extensive thermal experiments with an appropriate reflection of reliability metric are conducted to measure the components' temperatures and verify their performance in different operating conditions. [ABSTRACT FROM AUTHOR]