1. Interferometric method for simultaneous characterization of retardance and fast axis of a retarder.
- Author
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del Hoyo, Jesus, Andres-Porras, Joaquin, Soria-Garcia, Angela, Sanchez-Brea, Luis Miguel, Pastor-Villarrubia, Veronica, Elshorbagy, Mahmoud H., and Alda, Javier
- Subjects
- *
AZIMUTH , *MICHELSON interferometer , *COMPUTER simulation - Abstract
In this work, we propose a technique to simultaneously measure the absolute retardance and the fast axis azimuth of a retarder using a Michelson interferometer with polarization control. One of the mirrors is slightly tilted to obtain interference fringes with collimated beams. The sample to measure is rotated and the parameters are obtained from the fringes displacement. The technique does not require the use of additional previously characterized retarders in the measurement process, but only linear polarizers. The experimental results present errors of the order of 2 ∘ for the retardance and 1 ∘ for the azimuth of the fast axis. • Characterization method for optical retarders. • Determines the retardance and fast axis azimuth. • Direct method is fast and robust. • Fitting method is more precise. • Mathematical, numerical simulation and experimental demonstration. [ABSTRACT FROM AUTHOR]
- Published
- 2024
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