1. Identifying the influence of the intrinsic defects in Gd-doped ZnO thin-films.
- Author
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Flemban, T. H., Sequeira, M. C., Zhang, Z., Venkatesh, S., Alves, E., Lorenz, K., and Roqan, I. S.
- Subjects
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ZINC oxide thin films , *THIN film research , *ZINC oxide films , *RAMAN spectroscopy , *SPECTRUM analysis - Abstract
Gd-doped ZnO thin films were prepared using pulsed laser deposition at different oxygen pressures and varied Gd concentrations. The effects of oxygen deficiency-related defects on the Gd incorporation, optical and structural properties, were explored by studying the impact of oxygen pressure during deposition and post-growth thermal annealing in vacuum. Rutherford Backscattering Spectrometry revealed that the Gd concentration increases with increasing oxygen pressure for samples grown with the same Gd-doped ZnO target. Unexpectedly, the c-lattice parameter of the samples tends to decrease with increasing Gd concentration, suggesting that Gd-defect complexes play an important role in the structural properties. Using low-temperature photoluminescence (PL), Raman measurements and density functional theory calculations, we identified oxygen vacancies as the dominant intrinsic point defects. PL spectra show a defect band related to oxygen vacancies for samples grown at oxygen deficiency. [ABSTRACT FROM AUTHOR]
- Published
- 2016
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