15 results on '"Freestanding thin films"'
Search Results
2. Freestanding Perovskite Oxide Films: Synthesis, Challenges, and Properties.
- Author
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Chiabrera, Francesco M., Yun, Shinhee, Li, Ying, Dahm, Rasmus T., Zhang, Haiwu, Kirchert, Charline K. R., Christensen, Dennis V., Trier, Felix, Jespersen, Thomas S., and Pryds, Nini
- Subjects
- *
OXIDE coating , *PEROVSKITE , *THIN films - Abstract
In this review paper, recent progress in the fabrication, transfer, and fundamental physical properties of freestanding oxide perovskite thin films is discussed. First, the main strategies for the synthesis and transfer of freestanding perovskite thin films are analyzed. In this initial section, particular attention is devoted to the use of water‐soluble (Ca,Sr,Ba)3Al2O6 thin films as sacrificial layers, one of the most promising techniques for the fabrication of perovskite membranes. The main functionalities that have been observed in freestanding perovskite thin films are then reviewed. In doing so, the authors begin by describing the emergence of new phenomena in ultrathin perovskite membranes when released from the substrate. They then move on to a summary of the functional properties that are observed in freestanding perovskite membranes under the application of strain. Indeed, freestanding thin films offer the unique possibility to actively control the strain state far beyond what can be observed with traditional methods, allowing the investigation of the profound interplay between structural and electronic properties in oxides. Overall, this review highlights the potential of oxide‐based freestanding thin films to become the preferred platform for the study of novel functionalities in perovskite oxide materials. [ABSTRACT FROM AUTHOR]
- Published
- 2022
- Full Text
- View/download PDF
3. A Generic Sacrificial Layer for Wide‐Range Freestanding Oxides with Modulated Magnetic Anisotropy.
- Author
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Peng, Huining, Lu, Nianpeng, Yang, Shuzhen, Lyu, Yingjie, Liu, Zhiwei, Bu, Yifan, Shen, Shengchun, Li, Mingqiang, Li, Zhuolu, Gao, Lei, Lu, Sicheng, Wang, Meng, Cao, Hui, Zhou, Hua, Gao, Peng, Chen, Hanghui, and Yu, Pu
- Subjects
- *
THIN films , *CRYSTAL structure , *MAGNETIC properties , *ACETIC acid , *FLEXIBLE structures , *CARBONATED beverages - Abstract
Freestanding oxide nanomembranes have promising applications because of their novel electronic states and flexible crystalline structures. Several materials have been developed as sacrificial layers to exfoliate thin films from substrates via wet‐etching. However, these materials face great challenges in terms of either complicated crystalline structures or corrosive solutions. Here, a new sacrificial material, SrCoO2.5, is presented, which can be coherently grown with wide‐range strains and crystalline orientations and is also soluble in eco‐friendly solutions such as acetic acid, vinegar, and even carbonated drinks. With SrCoO2.5 as the sacrificial layer, high‐quality freestanding ferromagnetic SrRuO3 membranes are achieved from wide‐range epitaxial strains and different crystalline orientations. By investigating the evolution of the magnetic properties of these samples, it is discovered that epitaxial strain causes a distinct modification of the magnetic anisotropy of (001)pc‐oriented SrRuO3 samples, while its influence on the (110)pc and (111)pc samples is insignificant. This study not only demonstrates the freestanding SrRuO3 as a promising material for flexible spintronic devices, but also offers a great opportunity to engineer a wide range of strained and oriented complex oxides for novel freestanding electronics using this newly developed sacrificial material. [ABSTRACT FROM AUTHOR]
- Published
- 2022
- Full Text
- View/download PDF
4. Emergent strain engineering of multiferroic BiFeO3 thin films
- Author
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Fei Sun, Deyang Chen, Xingsen Gao, and Jun-Ming Liu
- Subjects
BiFeO3 ,Freestanding thin films ,Interface layer ,Thermal expansion ,Defect engineering ,Ultrafast photoinduced strain ,Materials of engineering and construction. Mechanics of materials ,TA401-492 - Abstract
BiFeO3, a single-phase multiferroic material, possesses several polymorphs and exhibits a strong sensitivity to strain. Recently, emergent strain engineering in BiFeO3 thin films has attracted intense interest, which can overcome the confines of traditional strain engineering introduced through the mismatch between the film and substrate. In this review, we discuss emerging non-traditional strain engineering approaches to create new ground states and manipulate novel functionalities in multiferroic BiFeO3 thin films. Through fabricating freestanding thin films, inserting an interface layer or utilizing thermal expansion mismatch, continuously tunable strain can be imposed beyond substrate limitations. Nanostructured evolution and defect introduction are discussed as efficient routes to introduce strain, promising for the development of new nanodevices. Ultrafast optical excitation, growth conditions and chemical doping driven strain are summarized as well. We hope this review will arouse the readers’ interest in this fascinating field.
- Published
- 2021
- Full Text
- View/download PDF
5. Enhanced Magnetoelectric Effects in Self-Assembled Hemispherical Close-Packed CoFe2O3-Pb(Zr0.52Ti0.48)O3 Thin Film.
- Author
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Meenachisundaram, Sridevi, Wakiya, Naoki, Muthamizhchelvan, Chellamuthu, Gangopadhyay, Parthasarathi, Sakamoto, Naonori, and Ponnusamy, Suruttaiyudaiyar
- Subjects
THIN films ,MAGNETOELECTRIC effect ,SURFACE area ,CHIEF financial officers - Abstract
With their promising enhanced magnetoelectric (ME) effects and multifunctional properties, 2D ME materials are garnering considerable research interest. However, experimental studies regarding ME effects are sparse. In order to enhance ME properties, it may be important to develop a strategy to prepare ordered ME thin film materials on suitable substrates. Materials ought to possess high surface area and less area of contact with the substrate. We investigate ME thin films consisting of CoFe
2 O4 (CFO)/Pb(Zr0.52 Ti0.48 )O3 (PZT)/LaNiO3 ·(LNO) on a Pt/Ti/SiO2 /Si substrate that were prepared using a radio-frequency magnetron sputtering technique. The method helps to relax the in-plane constraint force and enhances the coexistence of the ferromagnetic and ferroelectric phases at the interface of the materials. Interestingly, the freestanding hemispherical ME thin films exhibited huge changes in magnetic field-induced polarization. Compared with planar CFO/PZT thin films of similar dimensions, the measured polarization was more than twice as large in the freestanding hemispherical ME thin films. This facile physicochemical technique for preparing highly efficient, hierarchically ordered micro/nano-magnetoelectric thin films may be used for the fabrication of miniaturized devices. [ABSTRACT FROM AUTHOR]- Published
- 2021
- Full Text
- View/download PDF
6. Nanometer-Thick Sr2IrO4 Freestanding Films for Flexible Electronics.
- Author
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Shrestha, Sujan, Coile, Matthew, Menglin Zhu, Souri, Maryam, Jiwoong Kim, Pandey, Rina, Brill, Joseph W., Jinwoo Hwang, Jong-Woo Kim, and Seo, Ambrose
- Published
- 2020
- Full Text
- View/download PDF
7. Pulsed-Mode Metalorganic Vapor-Phase Epitaxy of GaN on Graphene-Coated c -Sapphire for Freestanding GaN Thin Films.
- Author
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Lee S, Abbas MS, Yoo D, Lee K, Fabunmi TG, Lee E, Kim HI, Kim I, Jang D, Lee S, Lee J, Park KT, Lee C, Kim M, Lee YS, Chang CS, and Yi GC
- Abstract
We report the growth of high-quality GaN epitaxial thin films on graphene-coated c -sapphire substrates using pulsed-mode metalorganic vapor-phase epitaxy, together with the fabrication of freestanding GaN films by simple mechanical exfoliation for transferable light-emitting diodes (LEDs). High-quality GaN films grown on the graphene-coated sapphire substrates were easily lifted off by using thermal release tape and transferred onto foreign substrates. Furthermore, we revealed that the pulsed operation of ammonia flow during GaN growth was a critical factor for the fabrication of high-quality freestanding GaN films. These films, exhibiting excellent single crystallinity, were utilized to fabricate transferable GaN LEDs by heteroepitaxially growing In
x Ga1- x N/GaN multiple quantum wells and a p -GaN layer on the GaN films, showing their potential application in advanced optoelectronic devices.- Published
- 2023
- Full Text
- View/download PDF
8. Freestanding Perovskite Oxide Films:Synthesis, Challenges, and Properties
- Author
-
Chiabrera, Francesco M., Yun, Shinhee, Li, Ying, Dahm, Rasmus T., Zhang, Haiwu, Kirchert, Charline K. R., Christensen, Dennis V., Trier, Felix, Jespersen, Thomas S., Pryds, Nini, Chiabrera, Francesco M., Yun, Shinhee, Li, Ying, Dahm, Rasmus T., Zhang, Haiwu, Kirchert, Charline K. R., Christensen, Dennis V., Trier, Felix, Jespersen, Thomas S., and Pryds, Nini
- Abstract
In this review paper, recent progress in the fabrication, transfer, and fundamental physical properties of freestanding oxide perovskite thin films is discussed. First, the main strategies for the synthesis and transfer of freestanding perovskite thin films are analyzed. In this initial section, particular attention is devoted to the use of water-soluble (Ca,Sr,Ba)3Al2O6 thin films as sacrificial layers, one of the most promising techniques for the fabrication of perovskite membranes. The main functionalities that have been observed in freestanding perovskite thin films are then reviewed. In doing so, the authors begin by describing the emergence of new phenomena in ultrathin perovskite membranes when released from the substrate. They then move on to a summary of the functional properties that are observed in freestanding perovskite membranes under the application of strain. Indeed, freestanding thin films offer the unique possibility to actively control the strain state far beyond what can be observed with traditional methods, allowing the investigation of the profound interplay between structural and electronic properties in oxides. Overall, this review highlights the potential of oxide-based freestanding thin films to become the preferred platform for the study of novel functionalities in perovskite oxide materials.
- Published
- 2022
9. Emergent strain engineering of multiferroic BiFeO3 thin films
- Author
-
Jun-Ming Liu, Xingsen Gao, Deyang Chen, and Fei Sun
- Subjects
Interface layer ,Materials science ,Nanotechnology ,02 engineering and technology ,Substrate (electronics) ,010402 general chemistry ,01 natural sciences ,Defect engineering ,Thermal expansion ,Strain engineering ,Ultrafast photoinduced strain ,lcsh:TA401-492 ,Multiferroics ,Thin film ,Strain (chemistry) ,Doping ,Metals and Alloys ,021001 nanoscience & nanotechnology ,0104 chemical sciences ,Surfaces, Coatings and Films ,Electronic, Optical and Magnetic Materials ,BiFeO3 ,Freestanding thin films ,lcsh:Materials of engineering and construction. Mechanics of materials ,0210 nano-technology - Abstract
BiFeO3, a single-phase multiferroic material, possesses several polymorphs and exhibits a strong sensitivity to strain. Recently, emergent strain engineering in BiFeO3 thin films has attracted intense interest, which can overcome the confines of traditional strain engineering introduced through the mismatch between the film and substrate. In this review, we discuss emerging non-traditional strain engineering approaches to create new ground states and manipulate novel functionalities in multiferroic BiFeO3 thin films. Through fabricating freestanding thin films, inserting an interface layer or utilizing thermal expansion mismatch, continuously tunable strain can be imposed beyond substrate limitations. Nanostructured evolution and defect introduction are discussed as efficient routes to introduce strain, promising for the development of new nanodevices. Ultrafast optical excitation, growth conditions and chemical doping driven strain are summarized as well. We hope this review will arouse the readers’ interest in this fascinating field.
- Published
- 2021
10. Freestanding Perovskite Oxide Films:Synthesis, Challenges, and Properties
- Author
-
Francesco M. Chiabrera, Shinhee Yun, Ying Li, Rasmus T. Dahm, Haiwu Zhang, Charline K. R. Kirchert, Dennis V. Christensen, Felix Trier, Thomas S. Jespersen, and Nini Pryds
- Subjects
Sacrificial layers ,Lattice strain ,Freestanding thin films ,Perovskite oxides ,Ultrathin membranes ,General Physics and Astronomy - Abstract
In this review paper, recent progress in the fabrication, transfer, and fundamental physical properties of freestanding oxide perovskite thin films is discussed. First, the main strategies for the synthesis and transfer of freestanding perovskite thin films are analyzed. In this initial section, particular attention is devoted to the use of water-soluble (Ca,Sr,Ba)3Al2O6 thin films as sacrificial layers, one of the most promising techniques for the fabrication of perovskite membranes. The main functionalities that have been observed in freestanding perovskite thin films are then reviewed. In doing so, the authors begin by describing the emergence of new phenomena in ultrathin perovskite membranes when released from the substrate. They then move on to a summary of the functional properties that are observed in freestanding perovskite membranes under the application of strain. Indeed, freestanding thin films offer the unique possibility to actively control the strain state far beyond what can be observed with traditional methods, allowing the investigation of the profound interplay between structural and electronic properties in oxides. Overall, this review highlights the potential of oxide-based freestanding thin films to become the preferred platform for the study of novel functionalities in perovskite oxide materials.
- Published
- 2022
- Full Text
- View/download PDF
11. Manipulation of thin film assemblies: Recent progress and novel concepts
- Author
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Krishnan, Venkata, Sakakibara, Keita, Mori, Taizo, Hill, Jonathan P., and Ariga, Katsuhiko
- Subjects
- *
THIN films , *MOLECULAR self-assembly , *SUPRAMOLECULAR chemistry , *NANOTECHNOLOGY , *INTERFACES (Physical sciences) , *SURFACE chemistry - Abstract
Abstract: Manipulation of self-assembly processes to construct predesigned supramolecular architectures in a controllable manner is of utmost importance in the field of nanotechnology for the development of application-oriented devices. We here summarize recent progress in the current strategies for the manipulation of thin film assemblies on solid surfaces and at interfaces, as well as in freestanding thin film structures. We also highlight our recent progress including a description of the concept of hand-operating nanotechnology for controlling thin film assemblies at dynamic interfaces. This review is organized into three sections: (i) functionalization and manipulation of solid surfaces to assist molecular self-assembly; (ii) manipulation of freestanding ultrathin films by self-assembly; and (iii) molecular assembly at dynamic interfaces. [Copyright &y& Elsevier]
- Published
- 2011
- Full Text
- View/download PDF
12. Fracture Toughness of Freestanding Metallic Thin Films Studied by Bulge Testing
- Author
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Preiß, Eva
- Subjects
Silver ,Crack propagation ,Dünnschichttechnik ,Mikromechanik ,Fracture toughness ,Single-crystalline films ,Bruchzähigkeit ,Rissausbreitung ,Thickness effect ,Physical vapor deposition (PVD) ,Freestanding thin films ,Atomic force microscopy (AFM) ,Au-Ag solid solutions ,Gold ,Bulge-Test ,Plane-strain bulge test ,Size-Effekt - Abstract
Metallic thin films are nowadays frequently used as key components in microelectronic and microelectromechanical systems, so that the functionalities of these systems often depend on the structural integrity of the incorporated thin films. As a result, the fracture toughness of thin films becomes a very important design parameter as it quantifies their resistance to crack propagation. This thesis explores why the fracture toughness of freestanding metallic thin films is surprisingly low in comparison to bulk metals and by which parameters it is affected. The fracture toughness of physical-vapor-deposited (PVD) freestanding metallic thin films was determined by bulge testing of previously notched membranes. The investigated films comprise polycrystalline gold films of 50 nm to 350 nm thickness, single-crystalline and polycrystalline silver films, and solid-solution hardened Au-Ag films. Thus, the obtained data allow for a comprehensive comparison of the fracture toughness of films with various micro-structures and properties. Complementary insights into the fracture mechanisms are gained by in-situ observations of deformation and crack propagation in an atomic force microscope. An intrinsic thickness effect is found to be the reason for the generally low fracture toughness of metallic thin films. It is shown that the low fracture toughness is associated with an extremely small fracture process zone that can be traced back to out-of-plane components of plastic deformation that are by nature unconstrained in thin samples. For films with similar microstructure, a clear trend of increasing fracture toughness with increasing yield stress is revealed. This relationship is at first sight counterintuitive but can be accounted for by an increased resistance to local thinning in front of the crack tip which plays a decisive role in thin-film fracture. Based on these findings, suggestions are finally presented on how to improve the fracture toughness of metallic thin films., Metallische Dünnschichten finden mittlerweile häufig Anwendung in der Mikroelektronik und in mikroelektromechanischen Systemen. Eine zentrale Anforderung an die Dünnschicht-Komponenten ist dabei ihre strukturelle Integrität, womit die Bruchzähigkeit metallischer Schichten, die deren Widerstand gegen Rissfortschritt quantitativ beschreibt, zur wichtigen Kenngröße wird. Diese Arbeit untersucht, weshalb die Bruchzähigkeit von freistehenden metallischen Dünnschichten im Vergleich zu makroskopischen Proben überraschend klein ist und durch welche Parameter sie beeinflusst wird. Dazu wurde die Bruchzähigkeit von freistehenden, durch physikalische Gasphasenabscheidung hergestellten Dünnschichten bestimmt, indem Bulge-Experimente an Membranen mit je einem zuvor eingebrachten Schlitz durchgeführt wurden. Die untersuchten Membranen umfassen polykristalline Goldschichten mit einer Dicke von 50 nm bis 350 nm, ein- und polykristalline Silberschichten sowie Au-Ag-Mischkristallschichten. Damit wird eine breite Datenbasis gelegt, anhand derer Dünnschichten mit verschiedener Mikrostruktur und deutlich unterschiedlichen Eigenschaften hinsichtlich ihrer Bruchzähigkeit verglichen werden können. Die quantitativen Messungen werden durch in-situ Beobachtungen im Rasterkraftmikroskop um Informationen zum Bruchmechanismus ergänzt. Ein intrinsischer Dickeneffekt kann als Grund für die generell niedrige Bruchzähigkeit von metallischen Dünnschichten bestätigt werden. Es wird gezeigt, dass der niedrige Widerstand gegen Rissausbreitung mit einer sehr kleinen plastischen Zone einhergeht, deren räumliche Begrenzung wiederum auf plastische Verformung aus der Schichtebene heraus zurückzuführen ist. Diese kann in freistehenden Schichten im Gegensatz zu makroskopischen Proben unbeeinträchtigt stattfinden. Für Schichten mit ähnlicher Mikrostruktur steigt die Bruchzähigkeit deutlich mit ansteigender Fließspannung an. Dies scheint zunächst überhaupt nicht intuitiv, kann aber dadurch erklärt werden, dass eine hohe Fließspannung einer lokalen Dickenabnahme, die beim Bruch von duktilen Dünnschichten eine entscheidende Rolle spielt, entgegenwirkt. Auf Grundlage der gewonnenen Erkenntnisse werden zuletzt Vorschläge dazu gemacht, wie die Bruchzähigkeit von metallischen Dünnschichten verbessert werden kann., FAU Forschungen Reihe B: Medizin, Naturwissenschaft, Technik (22)
- Published
- 2018
- Full Text
- View/download PDF
13. Freestanding Thin‐Films: Water‐Assisted Liftoff of Polycrystalline CdS/CdTe Thin Films Using Heterogeneous Interfacial Engineering (Adv. Mater. Interfaces 14/2019).
- Author
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Magginetti, David J., Aguiar, Jeffery A., Winger, Joshua R., Scarpulla, Michael A., Pourshaban, Erfan, and Yoon, Heayoung P.
- Subjects
THIN films ,SOLAR cells ,ELECTRON microscopy ,PHOSPHORESCENCE - Abstract
Highlights from the article: Freestanding Thin-Films: Water-Assisted Liftoff of Polycrystalline CdS/CdTe Thin Films Using Heterogeneous Interfacial Engineering (Adv. Keywords: electron microscopy; freestanding thin films; liftoff; polycrystalline CdTe; solar cells Electron microscopy, freestanding thin films, liftoff, polycrystalline CdTe, solar cells.
- Published
- 2019
- Full Text
- View/download PDF
14. Water‐Assisted Liftoff of Polycrystalline CdS/CdTe Thin Films Using Heterogeneous Interfacial Engineering.
- Author
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Magginetti, David J., Aguiar, Jeffery A., Winger, Joshua R., Scarpulla, Michael A., Pourshaban, Erfan, and Yoon, Heayoung P.
- Subjects
THIN films ,ELECTRON spectroscopy ,ELECTRON microscopy ,PROCESS optimization ,ENGINEERING - Abstract
Recent advances in device design and process optimizations have enabled the production of CdTe devices on flexible substrates, but the necessary high‐temperature processing (>450 °C) to recrystallize grains limits the use of alternative lightweight substrates. Here, a new synthesis method is reported to create a freestanding CdS/CdTe film by combining high‐temperature depositions (CdS/CdTe on Si/SiO2) and a simple lift‐off process in a water environment at room temperature. Analysis of the results indicate that the delamination is facilitated by the innate lattice mismatch as well as the presence of an unexpected Te‐rich layer (≈20 nm), which accumulates on the SiO2 surface. High‐resolution electron microscopy and spectroscopy measurements confirm that the CdS/CdTe film is physically liberated from the substrate without leaving any residue, while also preserving their initial structural and compositional properties. [ABSTRACT FROM AUTHOR]
- Published
- 2019
- Full Text
- View/download PDF
15. Validation of mechanical damage monitoring on aluminium freestanding thin films using electrical measurements
- Author
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Olivier Dalverny, Jean Michel Desmarres, Joël Alexis, Thibaut Fourcade, Cedric Seguineau, Adrien Broué, Talal Masri, Jeremie Dhenni, Centre National d'Études Spatiales - CNES (FRANCE), Institut National Polytechnique de Toulouse - INPT (FRANCE), NOVAMEMS (FRANCE), and Institut National Polytechnique de Toulouse - Toulouse INP (FRANCE)
- Subjects
Materials science ,Mechanical Engineering ,Matériaux ,chemistry.chemical_element ,Calculation methods ,Characterization (materials science) ,Uniaxial tensile test ,chemistry ,Freestanding thin films ,Mechanics of Materials ,Aluminium ,Forensic engineering ,General Materials Science ,Electrical measurements ,Composite material ,Thin film ,Aluminium film ,Damage measurement - Abstract
This paper describes a new technique allowing the monitoring of damage in metallic freestanding thin films during micro-tensile test by using electrical characterization. After a presentation of the set-up, results obtained on Aluminium thin coatings by using two calculation methods for damage variable are presented and commented.
- Published
- 2013
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