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Your search keyword '"Gateshki, Milen"' showing total 41 results
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41 results on '"Gateshki, Milen"'

1. Laboratory‐based 3D X‐ray standing‐wave analysis of nanometre‐scale gratings.

Author

Matveevskii, Ksenia, Nikolaev, Konstantin V., Fallica, Roberto, Beckers, Detlef, Gateshki, Milen, Kharchenko, Alexander, Spanjer, Bart, Rogachev, Alexander, Yakunin, Sergey, Ackermann, Marcelo, and Makhotkin, Igor A.

Subjects
STANDING waves, COPPER tubes, MANUFACTURING processes, METROLOGY, NANOSTRUCTURES
Abstract

The increasing structural complexity and downscaling of modern nanodevices require continuous development of structural characterization techniques that support R&D and manufacturing processes. This work explores the capability of laboratory characterization of periodic planar nanostructures using 3D X‐ray standing waves as a promising method for reconstructing atomic profiles of planar nanostructures. The non‐destructive nature of this metrology technique makes it highly versatile and particularly suitable for studying various types of samples. Moreover, it eliminates the need for additional sample preparation before use and can achieve sub‐nanometre reconstruction resolution using widely available laboratory setups, as demonstrated on a diffractometer equipped with a microfocus X‐ray tube with a copper anode. [ABSTRACT FROM AUTHOR]

Published
2024
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4. Structure of nanocrystalline alkali metal manganese oxides by the atomic pair distribution function technique

Author

Gateshki, Milen, Seong-ju Hwang, Park, Dae Hoon, Yang Ren, and Petkov, Valeri

Subjects
Alkali metals -- Atomic properties, X-rays -- Diffraction, X-rays -- Usage, Chemicals, plastics and rubber industries
Abstract

The atomic scale structure of two nanocrystalline K-Li-Mn-O-I materials obtained through Chimie Douce route in aqueous and acetone solutions are determined by using X-ray diffraction and atomic Pair Distribution Function technique. Some methodological aspects of the atomic pair distribution function technique and its applicability to study the structure of crystalline and nanocrystallinematerilas are described.

Published
2004

6. In-situ and Operando Characterization of Battery Materials using X-rays

Author

Sommariva, Marco, primary, Dadivanyan, Natalia, additional, Nenert, Gwilherm, additional, Fransen, Martijn, additional, Degen, Thomas, additional, Masiello, Fabio, additional, Bao, Zhaohui, additional, Wang, Lin, additional, Speakman, Scott, additional, Hawkridge, Mike, additional, and Gateshki, Milen, additional

Published
2020
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39. Structure of nanocrystalline MgFe2O4 from X-ray diffraction, Rietveld and atomic pair distribution function analysis.

Author

Gateshki, Milen, Petkov, Valeri, Pradhan, Swapan K., and Vogt, Tom

Subjects
*X-ray diffraction, *RIETVELD refinement, *X-ray crystallography technique, *NANOCRYSTALS, *FERRITES
Abstract

The three-dimensional structure of nanocrystalline magnesium ferrite, MgFe2O4, prepared by ball milling, has been determined using synchrotron radiation powder diffraction and employing both Rietveld and atomic pair distribution function (PDF) analysis. The nanocrystalline ferrite exhibits a very limited structural coherence length and a high degree of structural disorder. Nevertheless, the nanoferrite possesses a very well defined local atomic ordering that may be described in terms of a spinel-type structure with Mg2+ and Fe3+ ions almost randomly distributed over its tetrahedral and octahedral sites. The new structural information helps explain the material's unusual magnetic properties. [ABSTRACT FROM AUTHOR]

Published
2005
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