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The presence of high crystallographic symmetry and nanoscale defects are favorable for thermoelectrics. With proper electronic structures, a highly symmetric crystal tends to possess multiple carrier channels and promote electrical conductivity without sacrificing Seebeck coefficient. In addition, nanoscale defects can effectively scatter acoustic phonons to suppress thermal conductivity. Here, it is reported that the triple doping of Cu2SnSe3 leads to a high ZT value of 1.6 at 823 K for Cu1.85Ag0.15(Sn0.88Ga0.1Na0.02)Se3, and a decent average ZT (ZTave) value of 0.7 is also achieved for Cu1.85Ag0.15(Sn0.93Mg0.06Na0.01)Se3 from 475 to 823 K. This study reveals: 1) Ag doping on Cu sites generates numerous point defects and greatly decreases lattice thermal conductivity. 2) Doping Mg or Ga converts the monoclinic Cu2SnSe3 into a cubic structure. This symmetry enhancing leads to an increase in the effective mass from 0.8 me to 2.6 me (me, free electron mass) and the power factor from 4.3 µW cm−1 K−2 for Cu2SnSe3 to 11.6 µW cm−1 K−2. 3) Na doping creates dense dislocation arrays and nanoprecipitates, which strengthens the phonon scattering. 4) Pair distribution function analysis shows localized symmetry breakdown in the cubic Cu1.85Ag0.15(Sn0.88Ga0.1Na0.02)Se3. This work provides a standpoint to design promising thermoelectric materials by synergistically manipulating crystal symmetry and nanoscale defects. Agency for Science, Technology and Research (A*STAR) Ministry of Education (MOE) Submitted/Accepted version This work was supported by the U.S. Department of Energy, Office of Science Basic Energy Sciences under grant DE-SC0014520, DOE Office of Science (materials characterization, sample synthesis, transport properties). User Facilities were supported by the Office of Science of the U.S. Department of Energy under Contract Nos. DE-AC02-06CH11357 and DE-AC02-05CH11231. Access to facilities of high-performance computational resources at the Northwestern University is acknowledged. The authors also acknowledge Singapore MOE Tier 2 under Grant Nos. MOE2018-T2-1-010, Singapore A*STAR Pharos Program SERC 1527200022, and Singapore A*STAR project A19D9a0096.

International audience; In order to evaluate the instrumental parameters for the combined on-line-on-mine-real-time expert system SOLSA (http://www.solsa-mining.eu), portable and laboratory analyses were carried out on coarse granite, sandstone, serpentinized harzburgite and siliceous breccia. Each sample was studied at 5 different surface roughnesses (sonic or diamond drilled, cut, polished at 6 µm and 0.25 µm, sample powders). X-ray diffraction (XRD), portable Infra-Red (pIR) and X-ray-fluorescence (pXRF), and laboratory micro-Raman spectroscopy gave complementary and corroborating results. No major effect on the analyses was noted for the selected surface states. pXRF gave variable results except for the homogeneously serpentinized harzburgite, related to coarse or contrasting grain sizes or pores, small spot size (3 mm) and needs close-to-surface analyses. Portable IR (spot size 1.76 cm 2) is carried out close to surfaces while Raman spectroscopy (1-2 µm) is performed at distance. Sampling strategies have to be defined for each lithology. Major challenges for a combined on-line analysis are to adapt the specificities of the techniques to (1) analyse similar surface areas (from ~2 cm 2 (pIR) to < µm (Raman)), (2) smartly combine all the techniques into a single instrument, and (3) develop appropriate databases to reach a reliable " real-time " outcome results, which can be used for more precise geomodeling, and to rapidly define exploration and beneficiation parameters.

The SOLSA project aims to construct an analytical expert system for on-line-on-mine-real-time mineralogical and geochemical analyses on sonic drilled cores. A profilometer is indispensable to obtain reliable and quantitative data from RGB and hyperspectral cameras, and to get 3D definition of close-to-surface objects such as rheology (grain shape, grain size, fractures and vein systems), material hardness and porosities. Optical properties of minerals can be analyzed by focusing on the reflectance. Preliminary analyses were performed with the commercial scan control profilometer MI-CRO-EPSILON equipped with a blue 405 nm laser on a conveyor belt (depth resolution: 10 μm; surface resolution: 30x30 μm2 (maximum resolution; 1m drill core/4 min). Drill core parts and rocks with 4 different surface roughness states: (1) sonic drilled, (2) diamond saw-cut, polished at (3) 6 mm and (4) 0.25 μm were measured (see also abstract Duée et al. this volume). The ΜICRO- EPSILON scanning does not detect such small differences of surface roughness states. Profilometer data can also be used to access rough mineralogical identification of some mineral groups like Fe-Mg silicates, quartz and feldspars). Drill core parts from a siliceous mineralized breccia and laterite with high and deep porosity and fractures were analyzed. The determination of holes’ convexity and fractures) is limited by the surface/depth ratio. Depending on end-user’s needs, parameters such as fracture densities and mineral content should be combined, and depth and surface resolutions should be optimized, to speed up “on-line-on-mine-real- time” mineral and chemical analyses in order to reach the target of about 80 m/day of drilled core.

This work reports the peculiar properties of a graphene film prepared by the chemical vapor deposition (CVD) of ethylene in high vacuum on a well oriented and carefully cleaned Pt(111) crystal surface maintained at high temperature. In-situ and ex-situ characterization techniques (low energy electron diffraction, high resolution electron energy loss spectroscopy, scanning electron microscopy and Raman micro-spectroscopy) used here indicate the prevalence of single layer regions and the presence of two different orientations of the graphene sheets with respect to the Pt(111) substrate. In most of the deposited area evidence is found of a compressive stress for the graphene lattice, as a net result of the growth process on a metal substrate. This graphene film grown on Pt(111) exhibits a lower degree of order and of homogeneity with respect to the exfoliated graphene on Si/SiO2, as it is found generally for graphene on metals, but several characterization techniques indicates a better quality than in previous deposition experiments on the same metal substrate., Comment: 18 pages, 5 figures, Journal of Raman spectroscopy 2013