16 results on '"Goldbach, Matthias"'
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2. Impact of carbon junction implant on leakage currents and defect distribution: Measurement and simulation
3. Deformation of charge density waves in quasi-one-dimensional semiconductors visualized by scanning electron microscopy
4. From MFM Capacitors Toward Ferroelectric Transistors: Endurance and Disturb Characteristics of ${\rm HfO}_{2}$-Based FeFET Devices
5. SRAM read current variability and its dependence on transistor statistics
6. Ladungstransport indimensionsreduzierten Festkörpern
7. Intrinsic MOSFET leakage of high-k peripheral DRAM devices: Measurement and simulation
8. Leakage current and defect characterization of p+n-source/drain diodes
9. Carbon junction implant: Effect on leakage currents and defect distribution
10. Gate edge roughness in electron beam direct write and its influence to device characteristics
11. SRAM read current variability and its dependence on transistor statistics.
12. Gate edge roughness in electron beam direct write and its influence to device characteristics.
13. From MFM Capacitors Toward Ferroelectric Transistors: Endurance and Disturb Characteristics of HfO2-Based FeFET Devices.
14. Leakage current and defect characterization of p+n-source/drain diodes
15. Deformation of charge density waves in quasi-one-dimensional semiconductors visualized by scanning electron microscopy.
16. A METHOD OF FORMING A SILICON DIOXIDE LAYER ON A CURVED SILICON SURFACE
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