226 results on '"Haitjema, H"'
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2. Error compensation for laser line scanners
3. On-machine and in-process surface metrology for precision manufacturing
4. Measurement technologies for precision positioning
5. Calibration and verification of areal surface texture measuring instruments
6. The implication and evaluation of geometrical imperfections on manufactured surfaces
7. Geometric error measurement and compensation of machines—An update
8. Effect of process parameters on the surface topography formation in precision additive metal manufacturing
9. Development of a double sided stitching interferometer for wafer characterization
10. Dimensional Micro and Nano Metrology
11. Noise bias removal in profile measurements
12. Validation of a single fibre-fed heterodyne laser interferometer with nanometre uncertainty
13. Laser Polarization State Measurement in Heterodyne Interferometry
14. Modeling and verifying non-linearities in heterodyne displacement interferometry
15. A novel technique for calibration of polygon angles with non-integer subdivision of indexing table
16. Development of a Silicon-based Nanoprobe System for 3-D Measurements
17. New mechanistic aspects on the formation of poly(isothianaphthene) from P4S10 and phthalic anhydride derivatives: carbon–carbon bond formation and cleavage via a cyclic reaction mechanism
18. Deformation and wear of pyramidal, silicon-nitride AFM tips scanning micrometre-size features in contact mode
19. Paradoxical bradycardia during surgical caudal vena cava occlusion in an anesthetized dog
20. Regional Modelling of Fractured Rock Aquifers
21. Development and Applications of Three-Dimensional Analytic Element Models for Transport Modelling
22. An international comparison of surface texture parameters quantification on polymer artefacts using optical instruments
23. Materials behaviour in metal curring: strains, strain rates and temperatures in chip formation
24. An international comparison of surface texture parameters quantification on polymer artefacts using optical instruments
25. THE PHYSICAL PROPERTIES OF PYROLYTICALLY SPRAYED TINDIOXIDE COATINGS
26. THE PHYSICAL PROPERTIES OF FLUORINE-DOPED TINDIOXIDE COATINGS FOR SOLAR COLLECTORS
27. Fiber characterization for application in heterodyne laser interferometry with nanometre uncertainty, Part 1: Polarization state measurements
28. Development of a fibre-fed heterodyne laser interferometer with nanometer uncertainty
29. Calibration and redesign of a nano probe based on MST technology
30. Development of a fibre-fed heterodyne laser interferometer with nanometer uncertainty
31. High-accuracy CMM metrology for micro systems
32. Method for approximate noise elimination in form and roughness measurements
33. Traceable calibration of non-linearities in laser interferometers
34. A calibration setup for a new type of nano probe
35. Heterodyne laser interferometer using a single polarisation-preserving optical fibre
36. A scanning wafer thickness and flatness interferometer
37. Overzicht van de veranderingen bij normgeving op het gebied van ruwheid
38. Laser Beam Machining of Microlenses by Hole Area Modulation (HAM) Methode
39. Design of a Magnetic Bearing
40. EUSPEN : proceedings of the 3rd international conference, May 26-30, 2002, Eindhoven, The Netherlands
41. Virtual CMM using Monte Carlo methods based on frequency content of the error signal
42. International comparisons of He-Ne lasers stabilized with (sup. 127) I (sub 2) at [lambda] approximately equals 633 nm (July 1993 to September 1995). Part IV: Comparison of Western European lasers at [lambda] approximately equals 633 nm
43. Traceability of CMM measurements
44. Long gauge block measurements based on a Twyman-Green interferometer and three stabilized lasers
45. A ball diameter-measuring instrument in a gauge block interferometer
46. Uncertainty estimation of 2.5-D roughness parameters obtained by mechanical probing
47. A calibration platform for generating parallel displacements with nanometer accuracy
48. Iterative solution of least-squares problems applied to flatness and grid measurements
49. Dynamic calibration of probes in the μm region with nanometric accuracy
50. On Modeling Weak Sinks in MODPATH
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