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LnTisb x Ta 1-x O 6 ceramics were prepared by the conventional solid-state ceramic route for x = 0, 0.05, 0.1, 0.15, and 0.2. The structures of the materials were analyzed using X-ray diffraction techniques. The cell parameters and the theoretical densities of the samples were calculated using least square methods. The materials are sintered to > 94% of theoretical density at 1480°C. The microwave dielectric properties were measured using the cavity resonator method. The surface morphology of the sintered samples was analyzed using scanning electron microscopy. All the materials have good microwave dielectric properties and are suitable for dielectric resonator applications.