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Dielectric Laser Acceleration (DLA) achieves the high- est gradients among structure-based electron accelerators. The use of dielectrics increases the breakdown field limit, and thus the achievable gradient, by a factor of at least 10 in comparison to metals. Experimental demonstrations of DLA in 2013 led to the Accelerator on a Chip International Program (ACHIP), funded by the Gordon and Betty Moore Foundation. In ACHIP, our main goal is to build an acceler- ator on a silicon chip, which can accelerate electrons from below 100keV to above 1MeV with a gradient of at least 100MeV/m. For stable acceleration on the chip, magnet- only focusing techniques are insufficient to compensate the strong acceleration defocusing. Thus spatial harmonic and Alternating Phase Focusing (APF) laser-based focusing tech- niques have been developed. We have also developed the simplified symplectic tracking code DLAtrack6D, which makes use of the periodicity and applies only one kick per DLA cell, which is calculated by the Fourier coefficient of the synchronous spatial harmonic. Due to coupling, the Fourier coefficients of neighboring cells are not entirely independent and a field flatness optimization (similarly as in multi-cell cavities) needs to be performed. The simu- lation of the entire accelerator on a chip by a Particle In Cell (PIC) code is possible, but impractical for optimization purposes. Finally, we have also outlined the treatment of wake field effects in attosecond bunches in the grating within DLAtrack6D, where the wake function is computed by an external solver., Proceedings of the 13th Int. Computational Accelerator Physics Conf., ICAP2018, Key West, FL, USA

We have developed a new type of microscope possessing a unique feature of observing both scanning electron and X-ray images under one unit. Unlike former X-ray microscopes using SEM [1, 2], this scanning electron and X-ray (SELX) microscope has a sample in vacuum, thus it enables one to observe a surface structure of a sample by SEM mode, to search the region of interest, and to observe an X-ray image which transmits the region. For the X-ray observation, we have been focusing on the soft X-ray region from 280 eV to 3 keV to observe some bio samples and soft materials. The resolutions of SEM and X-ray modes are 50 nm and 100 nm, respectively, at the electron energy of 7 keV.