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Your search keyword '"Hosoki, Shigeyuki"' showing total 88 results
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88 results on '"Hosoki, Shigeyuki"'

1. Observation of natural oxide growth on silicon facets using an atomic force microscope with current measurement

Author

Hosaka, Sumio, Koyanagi, Hajime, Hasegawa, Tsuyoshi, Hosoki, Shigeyuki, and Hiraiwa, Atsushi

Subjects
Oxides -- Research, Silicon -- Oxidation, Atomic force microscopy -- Usage, Physics
Abstract

Atomic force microscopy and current imaging tunneling spectroscopy were used to investigate natural oxide growth on silicon facets. The results showed that natural oxide growth on some special high-index-orientation silicon facets in the vicinity of {111} was smaller than that on the other silicon facets.

Published
1992

36. Tip Aspect Dependence in Angular Confinement of Electron Emission from Ti/W<001> Field Emitter.

Author

KURODA, Katsuhiro, HOSOKI, Shigeyuki, and KOMODA, Tsutomu

Abstract

Titaniated tungsten field emitter tip confines electron emission to a small angle. The tip was successfully observed with a high resolution scanning electron microscope to clarify the cause of the confinement. The observed emitters were W<001> and Ti/W<001>. Crystallographic planes were clearly visible in the observation of the W<001> emitter tip. On the other hand, the Ti/W<001> emitter tip was found to have a quite unique aspect in that a facet was produced at {100} plane only. It was found that these tip aspects correspond well with the field emission micrograph patterns. Especially, it was found that the reason why Ti/W emitter confines electron emission to a small angle is that the work function value of the {100} plane is selectively decreased by adsorbing titanium and oxygen. [ABSTRACT FROM PUBLISHER]

Published
1987

38. Observation of Tungsten Field Emitter Tips with an Ultra-High Resolution Field Emission Scanning Electron Microscope

Author

Kuroda, Katsuhiro, Hosoki, Shigeyuki, and Komoda, Tsutomu

Subjects
titaniated tungsten field emitter tip, crystallographic plane, tungsten field emitter tip, Ultra-high resolution, field emission electron source, Physics::Accelerator Physics, atomic layer, Life Sciences, in-lens type objective lens
Abstract

Tungsten emitter tips are observed with a prototype scanning electron microscope with an approximate SA electron beam size at an accelerating voltage of 30kV. A field emission electron source and in-lens type objective lens are incorporated into the electron column. A special specimen stage was designed to clean the emitter tips using a flashing operation and to reduce contamination by heating them during the observation. The observed emitters were W< 011 >, W< 001 > and Ti/W< 001 >. The crystallographic planes were clearly visible in the W< 011 > and W< 001 > observation. It was also possible to observe atomic layer steps of 4.5A during the recrystallization process by flashing operation of W< 011 >. In the observation of Ti/W, it was found that the aspect was quite different from that of the W< 001 > crystal surface. The observed field emission micrograph pattern was in good agreement with the tip shape.

Published
1987

39. Observation of pn junctions on implanted silicon using a scanning tunneling microscope.

Author

Hosaka, Sumio, Hosoki, Shigeyuki, Takata, Keiji, Horiuchi, Katsutada, and Natsuaki, Nobuyoshi

Subjects
*SILICON, *SCANNING tunneling microscopy
Abstract

Si pn junctions fabricated by photoresist masked As+ implantation were observed using current imaging tunneling spectroscopy (CITS) in a scanning tunneling microscope (STM). Using the CITS, a specific bias was chosen to define n-type or p-type areas according to whether or not current flowed. The pn junctions could be easily identified from the current image at this bias and in the STM topographic image. It also proved possible to find processing faults related to implantation. The STM images also identified the structure (corrugations) near the junctions, associated with volume expansion caused by implantation and annealing. [ABSTRACT FROM AUTHOR]

Published
1988
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40. Tunneling acoustic microscope.

Author

Takata, Keiji, Hasegawa, Tsuyoshi, Hosaka, Sumio, Hosoki, Shigeyuki, and Komoda, Tsutomu

Subjects
ACOUSTIC microscopes, SCANNING tunneling microscopy
Abstract

A new type of microscope, which is based upon both a scanning tunneling microscope (STM) and a technique for detecting acoustic waves, is described. An acoustic wave generated in a STM’s sample, by vibration of its tip, is detected by a piezoelectric transducer coupled to the sample. The amplitude of the acoustic wave corresponds to the strength of the force interaction between the tip and the sample, and is sensitive to tip-sample spacing. We have been successful in keeping the spacing constant by using a new feedback loop that holds this amplitude constant without tunneling. This method enhances the features of the STM without reducing its functions and enables simultaneous use of both force interactions and tunneling current to investigate the properties of samples. Topographies taken by the new feedback system and tunneling current images are shown. [ABSTRACT FROM AUTHOR]

Published
1989
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41. SHINKU

Author

OKANO, Hiroshi, primary, FUTAMOTO, Masaaki, additional, HOSOKI, Shigeyuki, additional, and KAWABE, Ushio, additional

Published
1977
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43. SHINKU

Author

FUTAMOTO, Masaaki, primary, HOSOKI, Shigeyuki, additional, YAMAMOTO, Shigehiko, additional, and KAWABE, Ushio, additional

Published
1980
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49. Tunneling Acoustic Microscope

Author

Takata, Keiji, primary, Yugami, Jiro, additional, Hasegawa, Tsuyoshi, additional, Hosaka, Sumio, additional, Hosoki, Shigeyuki, additional, and Komoda, Tsutomu, additional

Published
1989
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