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7. RESURF Region Variation Induced Current Crowding Effect on HV p-LDMOS

8. Optimizing Device Metal Routing Layouts by the Simulation Tool

9. Transmission Line Pulse Width Impacting on Device Performances

10. Bipolar Transistors’ Holding Phenomena

12. 30.8 3D Wireless Power Transfer with Noise Cancellation Technique for −62dB Noise Suppression and 90.1% Efficiency

14. Monolithic GaN-Based Gate Driver With On-Chip Adaptive On-Time Controller and Negative Current Slope Detector to Prevent Shoot-Through

17. Gate Voltages Impacting on Latch-up Measurements

18. EOS Endurance Power Circuits without Depletion Mode Devices

25. The Correlations between ESD and TLP in Large Array Devices

29. ESD Protection for Poly Fuses

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