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Your search keyword '"Huang, Xinyue"' showing total 653 results
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653 results on '"Huang, Xinyue"'

1. Intrinsic localized excitons in MoSe$_2$/CrSBr heterostructures

Author

Huang, Xinyue, Song, Zhigang, Gao, Yuchen, Gu, Pingfan, Watanabe, Kenji, Taniguchi, Takashi, Yang, Shiqi, Chen, Zuxin, and Ye, Yu

Subjects
Condensed Matter - Mesoscale and Nanoscale Physics
Abstract

We present a comprehensive investigation of optical properties in MoSe$_2$/CrSBr heterostructures, unveiling the presence of localized excitons represented by a new emission feature, X$^*$. We demonstrate through temperature- and power-dependent photoluminescence spectroscopy that X$^*$ originates from excitons confined by intrinsic defects within the CrSBr layer. The valley polarization of X$^*$ and trion peaks displays opposite polarity under a magnetic field, which closely correlates with the magnetic order of CrSBr. This is attributed to spin-dependent charge transfer mechanisms across the heterointerface, supported by density functional theory calculations revealing a type-II band alignment and spin-polarized band structures. Furthermore, the strong in-plane anisotropy of CrSBr induces unique polarization-dependent responses in MoSe$_2$ emissions. Our study highlights the crucial role of defects in shaping excitonic properties. It offers valuable insights into spectral-resolved proximity effects in van der Waals heterostructures between semiconductor and magnet, contributing to advancing spintronic and valleytronic devices., Comment: 9 pages, 4 figures

Published
2024

6. Two-dimensional materials for future information technology: status and prospects

Author

Qiu, Hao, Yu, Zhihao, Zhao, Tiange, Zhang, Qi, Xu, Mingsheng, Li, Peifeng, Li, Taotao, Bao, Wenzhong, Chai, Yang, Chen, Shula, Chen, Yiqi, Cheng, Hui-Ming, Dai, Daoxin, Di, Zengfeng, Dong, Zhuo, Duan, Xidong, Feng, Yuhan, Fu, Yu, Guo, Jingshu, Guo, Pengwen, Hao, Yue, He, Jun, He, Xiao, Hu, Jingyi, Hu, Weida, Hu, Zehua, Huang, Xinyue, Huang, Ziyang, Imran, Ali, Kong, Ziqiang, Li, Jia, Li, Qian, Li, Weisheng, Liao, Lei, Liu, Bilu, Liu, Can, Liu, Chunsen, Liu, Guanyu, Liu, Kaihui, Liu, Liwei, Liu, Sheng, Liu, Yuan, Lu, Donglin, Ma, Likuan, Miao, Feng, Ni, Zhenhua, Ning, Jing, Pan, Anlian, Ren, Tian-Ling, Shu, Haowen, Sun, Litao, Sun, Yue, Tao, Quanyang, Tian, Zi-Ao, Wang, Dong, Wang, Hao, Wang, Haomin, Wang, Jialong, Wang, Junyong, Wang, Wenhui, Wang, Xingjun, Wang, Yeliang, Wang, Yuwei, Wang, Zhenyu, Wen, Yao, Wu, Haidi, Wu, Hongzhao, Wu, Jiangbin, Wu, Yanqing, Xia, Longfei, Xiang, Baixu, Xing, Luwen, Xiong, Qihua, Xiong, Xiong, Xu, Jeffrey, Xu, Tao, Xu, Yang, Yang, Liu, Yang, Yi, Yang, Yuekun, Ye, Lei, Ye, Yu, Yu, Bin, Yu, Ting, Zeng, Hui, Zhang, Guangyu, Zhang, Hongyun, Zhang, Jincheng, Zhang, Kai, Zhang, Tao, Zhang, Xinbo, Zhang, Yanfeng, Zhao, Chunsong, Zhao, Yuda, Zheng, Ting, Zhou, Peng, Zhou, Shuyun, Zhu, Yuxuan, Yang, Deren, Shi, Yi, Wang, Han, and Wang, Xinran

Published
2024
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7. Conflict-driven Structural Learning Towards Higher Coverage Rate in ATPG

Author

Zhen, Hui-Ling, Wang, Naixing, Huang, Junhua, Huang, Xinyue, Yuan, Mingxuan, and Huang, Yu

Subjects
Computer Science - Artificial Intelligence, Computer Science - Neural and Evolutionary Computing
Abstract

Due to the increasing challenges posed by the relentless rise in the design complexity of integrated circuits, Boolean Satisfiability (SAT) has emerged as a robust alternative to structural APTG techniques. However, the high cost of transforming a circuit testing problem to a Conjunctive Normal Form (CNF) limits the application of SAT in industrial ATPG scenarios, resulting in a loss of test coverage. In Order to address this problem, this paper proposes a conflict-driven structural learning (CDSL) ATPG algorithm firstly, in which the conflict-driven heuristic methods in modern SAT solver are implemented on the logic cone of fault propagation and activation directly. The proposed CDSL algorithm is composed of three parts: (1) According to the implication graph, various conflict constraints have been learned to prune search space. (2) Conflict-driven implication and justification have been applied to increase decision accuracy and solving efficiency. (3) A conflict-based diagnosis method is further proposed in the case of low coverage debug, leading to making the aborted faults testable by relaxing or modifying some constraints on primary inputs. Extensive experimental results on industrial circuits demonstrate the effectiveness and efficiency of the proposed CDSL algorithm. It is shown that compared with the SAT-based ATPG, the proposed CDSL can on average decrease $25.6\%$ aborted faults with $94.51\%$ less run time. With a two-stage computational flow, it has shown that the proposed CDSL can lead to $46.37\%$ less aborted faults than a one-stage structural algorithm, further with the $3.19\%$ improvement on fault coverage. In addition, the conflict diagnosis can lead to $8.89\%$ less aborted faults on average, and $0.271\%$ improvement in fault coverage rate.

Published
2023

8. Model-Guided Synthesis for LTL over Finite Traces

Author

Xiao, Shengping, Li, Yongkang, Huang, Xinyue, Xu, Yicong, Li, Jianwen, Pu, Geguang, Strichman, Ofer, Vardi, Moshe Y., Goos, Gerhard, Series Editor, Hartmanis, Juris, Founding Editor, van Leeuwen, Jan, Series Editor, Hutchison, David, Editorial Board Member, Kanade, Takeo, Editorial Board Member, Kittler, Josef, Editorial Board Member, Kleinberg, Jon M., Editorial Board Member, Kobsa, Alfred, Series Editor, Mattern, Friedemann, Editorial Board Member, Mitchell, John C., Editorial Board Member, Naor, Moni, Editorial Board Member, Nierstrasz, Oscar, Series Editor, Pandu Rangan, C., Editorial Board Member, Sudan, Madhu, Series Editor, Terzopoulos, Demetri, Editorial Board Member, Tygar, Doug, Editorial Board Member, Weikum, Gerhard, Series Editor, Vardi, Moshe Y, Series Editor, Bertino, Elisa, Editorial Board Member, Gao, Wen, Editorial Board Member, Steffen, Bernhard, Editorial Board Member, Yung, Moti, Editorial Board Member, Woeginger, Gerhard, Editorial Board Member, Dimitrova, Rayna, editor, Lahav, Ori, editor, and Wolff, Sebastian, editor

Published
2024
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