30 results on '"Hung, Yang-Hao"'
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2. Improving Hot Carrier Reliability of Organic-TFTs by Extended Electrode
3. Second harmonic generation and simplified bond hyperpolarizability model analyses on the intermixing of Si/SiGe stacked multilayers for gate-all-around structure
4. Structure of an In Situ Phosphorus-Doped Silicon Ultrathin Film Analyzed Using Second Harmonic Generation and Simplified Bond-Hyperpolarizability Model
5. Abnormal Threshold Voltage Degradation Under Semi-On State Stress in Si3N4/AlGaN/GaN-HEMT
6. Investigation of the Self-Heating Effect in High Performance Organic TFTs With Multi-Finger Structure
7. Asymmetric Electrode Structure Induces Dual-Channel Phenomenon Under Hot-Carrier Stress in Organic Thin-Film Transistors
8. Stably Saturated Output Current Characteristics and Hot-Carrier Reliability of a-InGaZnO Thin-Film Transistors With Source-Connected Field Plate
9. Physical Mechanism of the Mechanical Bending of High-Performance Organic TFTs and the Effect of Atmospheric Factors
10. Enhancing Reliability and 2 mm-Axial Mechanical Bending Endurance by Gate Insulator Improvements in Flexible Polycrystalline Silicon TFTs
11. Suppressing Drain-Induced Barrier Lowering and Kink Effect in Low-Temperature Poly-Si TFTs Using a Partitioned Light Shield
12. Analysis of self-heating-related instability in n-channel low-temperature polysilicon TFTs with different S/D contact hole densities
13. Improving Reliability of a-InGaZnO TFTs With Optimal Location of Al₂O₃ Passivation in Moist Environment
14. Improving Drain-induced Barrier Lowing Effect and Hot Carrier Reliability with Terminal Via Structure on Half-Corbino Organic Thin-Film Transistors
15. Abnormal Threshold Voltage Degradation Under Semi-On State Stress in Si 3 N 4 /AlGaN/GaN-HEMT.
16. Impact of AC Stress in Low Temperature Polycrystalline Silicon Thin Film Transistors Produced With Different Excimer Laser Annealing Energies
17. Investigation of Thermal Behavior on High-Performance Organic TFTs Using Phase Separated Organic Semiconductors
18. Improving Reliability of a-InGaZnO TFTs With Optimal Location of Al 2 O 3 Passivation in Moist Environment.
19. Degradation Behavior of Etch-Stopper-Layer Structured a-InGaZnO Thin-Film Transistors Under Hot-Carrier Stress and Illumination
20. Gate Dielectric Leakage Reduction in Hard-Mask Defined and Dry-Etch Patterned Organic TFTs devices
21. Heterojunction Channels in Oxide Semiconductors for Visible‐Blind Nonvolatile Optoelectronic Memories
22. Improving a-InGaZnO TFTs Reliability by Optimizing Electrode Capping Structure Under Negative Bias Illumination Stress
23. Abnormal Hump Effect Induced by Hydrogen Diffusion During Self-Heating Stress in Top-Gate Amorphous InGaZnO TFTs
24. Investigation of HCD- and NBTI-Induced Ultralow Electric Field GIDL in 14-nm Technology Node FinFETs
25. Effects of Redundant Electrode Width on Stability of a-InGaZnO Thin-Film Transistors Under Hot-Carrier Stress
26. Enhancement of Mechanical Bending Stress Endurance Using an Organic Trench Structure in Foldable Polycrystalline Silicon TFTs
27. Influence of Hot Carriers and Illumination Stress on a-InGaZnO TFTs With Asymmetrical Geometry
28. Abnormal Increment Substrate Current After Hot Carrier Stress in n-FinFET
29. Formation of Hump Effect Due to Top-Gate Bias Stress in Organic Thin-Film Transistors
30. Gate Dielectric Leakage Reduction in Hard-Mask Defined and Dry-Etch Patterned Organic TFTs Devices.
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