6 results on '"Hwang, Jung Yoon"'
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2. Yield prediction via spatial modeling of clustered defect counts across a wafer map
3. Model-based clustering for integrated circuit yield enhancement
4. Allelic Variation at Loci Associated with Grain Properties in Korean Wheat Cultivars
5. Parametric Yield Modeling Using Hidden Variable Logistic Regression
6. Modeling of Integrated Circuit Yield Using a Spatial Nonhomogeneous Poisson Process
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