28 results on '"Ichikawa, Tamotsu"'
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2. Design Consideration for LC Analog Filters: Inductor ESR Compensation, Mutual Inductance Effect and Variable Center Frequency
3. 12 bit 1 ps Resolution Time-to-Digital Converter for LSI Test System
4. 12 bit 1 ps Resolution Time-to-Digital Converter for LSI Test System
5. Revisit to Histogram Method for ADC Linearity Test: Examination of Input Signal and Ratio of Input and Sampling Frequencies
6. Low Distortion Sinusoidal Signal Generator with Harmonics Cancellation Using Two Types of Digital Predistortion
7. A Physically Unclonable Function Using Time-to-Digital Converter with Linearity Self-Calibration and its FPGA Implementation
8. Low distortion sine wave generator with simple harmonics cancellation circuit and filter for analog device testing
9. High Precision Voltage Measurement System Utilizing Low-End ATE Resource and BOST
10. Evaluation of Code Selective Histogram Algorithm For ADC Linearity Test
11. Metallic Ratio Equivalent-Time Sampling and Application to TDC Linearity Calibration
12. Innovative Practices Track: Innovative Analog Circuit Testing Technologies
13. Evaluation of High-Precision Nano-Ampere Current Measurement Method for Mass Production
14. High Precision Measurement of Sub-Nano Ampere Current in ATE Environment
15. Revisit to Accurate ADC Testing with Incoherent Sampling Using Proper Sinusoidal Signal and Sampling Frequencies
16. Summing Node and False Summing Node Methods: Accurate Operational Amplifier AC Characteristics Testing without Audio Analyzer
17. Metallic Ratio Equivalent-Time Sampling: A Highly Efficient Waveform Acquisition Method
18. Input Signal and Sampling Frequencies Requirements for Efficient ADC Testing with Histogram Method
19. Summing Node Test Method: Simultaneous Multiple AC Characteristics Testing of Multiple Operational Amplifiers
20. Accurate Testing of Precision Voltage Reference by DC-AC Conversion
21. Analog/Mixed-Signal Circuit Testing Technologies in IoT Era
22. Consideration on Input Signal for ADC Histogram Test in Short Time
23. High-Resolution Low-Sampling-Rate Δ∑ ADC Linearity Short-Time Testing Algorithm
24. Evaluation of Null Method for Operational Amplifier Short-Time Testing
25. Accurate and Fast Testing Technique of Operational Amplifier DC Offset Voltage in µV-Order by DC-AC Conversion
26. Innovative Test Practices in Japan
27. Consideration on Input Signal for ADC Histogram Test in Short Time
28. Tetsu-to-Hagane
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