1. Chemical potential pinning due to equilibrium electron transfer at metal/C60-doped polymer interfaces
- Author
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J. P. Ferraris, N. N. Barashkov, Darryl L. Smith, Christian Maria Anton Heller, and Ian Campbell
- Subjects
chemistry.chemical_classification ,Materials science ,Band gap ,Doping ,General Physics and Astronomy ,Electron acceptor ,Polaron ,Electron transfer ,chemistry ,Chemical physics ,Computational chemistry ,Molecule ,Work function ,Thin film - Abstract
We report electroabsorption measurements of the built-in electrostatic potential in metal/C60-doped polymer/metal structures to investigate chemical potential pinning due to equilibrium electron transfer from a metal contact to the electron acceptor energy level of C60 molecules in the polymer film. The built-in potentials of a series of structures employing thin films of both undoped and C60-doped poly[2-methoxy, 5-(2′-ethyl-hexyloxy)-1,4-phenylene vinylene] (MEH-PPV) were measured. For undoped MEH-PPV, which has an energy gap of about 2.4 eV, the maximum built-in potential is about 2.1 eV, whereas for C60-doped MEH-PPV the maximum built-in potential decreases to 1.5 eV. Electron transfer to the C60 molecules close to the metal interface pins the chemical potential of the metal contact near the electron acceptor energy level of C60 and decreases the built-in potential of the structure. From the systematic dependence of the built-in potential on the metal work function we find that the electron acceptor energy level of C60 in MEH-PPV is about 1.7 eV above the hole polaron energy level of MEH-PPV.
- Published
- 1997