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In most PUF-based authentication schemes, a central server is usually engaged to verify the response of the device's PUF to challenge bit-streams. However, the server availability may be intermittent in practice. To tackle such an issue, this paper proposes a new protocol for supporting distributed authentication while avoiding vulnerability to information leakage where CRPs could be retrieved from hacked devices and collectively used to model the PUF. The main idea is to provision for scrambling the challenge bit-stream in a way that is dependent on the verifier. The scrambling pattern varies per authentication round for each device and independently across devices. In essence, the scrambling function becomes node- and packet-specific and the response received by two verifiers of one device for the same challenge bit-stream could vary. Thus, neither the scrambling function can be reverted, nor the PUF can be modeled even by a collusive set of malicious nodes. The validation results using data of an FPGA-based implementation demonstrate the effectiveness of our approach in thwarting PUF modeling attacks by collusive actors. We also discuss the approach resiliency against impersonation, Sybil, and reverse engineering attacks.

With the outsourcing of design flow, ensuring the security and trustworthiness of integrated circuits has become more challenging. Among the security threats, IC counterfeiting and recycled ICs have received a lot of attention due to their inferior quality, and in turn, their negative impact on the reliability and security of the underlying devices. Detecting recycled ICs is challenging due to the effect of process variations and process drift occurring during the chip fabrication. Moreover, relying on a golden chip as a basis for comparison is not always feasible. Accordingly, this paper presents a recycled IC detection scheme based on delay side-channel testing. The proposed method relies on the features extracted during the design flow and the sample delays extracted from the target chip to build a Neural Network model using which the target chip can be truly identified as new or recycled. The proposed method classifies the timing paths of the target chip into two groups based on their vulnerability to aging using the information collected from the design and detects the recycled ICs based on the deviation of the delay of these two sets from each other.

In this paper, we introduce DFSSD, a novel logic locking solution for sequential and FSM circuits with a restricted (locked) access to the scan chain. DFSSD combines two techniques for obfuscation: (1) Deep Faults, and (2) Shallow State Duality. Both techniques are specifically designed to resist against sequential SAT attacks based on bounded model checking. The shallow state duality prevents a sequential SAT attack from taking a shortcut for early termination without running an exhaustive unbounded model checker to assess if the attack could be terminated. The deep fault, on the other hand, provides a designer with a technique for building deep, yet key recoverable faults that could not be discovered by sequential SAT (and bounded model checker based) attacks in a reasonable time.

In this paper, we introduce a Learning Assisted Side Channel delay Analysis (LASCA) methodology for Hardware Trojan detection. Our proposed solution, unlike the prior art, does not require a Golden IC. Instead, it trains a Neural Network to act as a process tracking watchdog for correlating the static timing data (produced at design time) to the delay information obtained from clock frequency sweeping (at test time) for the purpose of Trojan detection. Using the LASCA flow, we detect close to 90% of Hardware Trojans in the simulated scenarios.