31 results on '"Kim, Sung-Shick"'
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2. Supply Chain Network Design and Transshipment Hub Location for Third Party Logistics Providers
3. Intelligent adaptive process control using dynamic deadband for semiconductor manufacturing
4. Spline regression based feature extraction for semiconductor process fault detection using support vector machine
5. Dispatching rule for non-identical parallel machines with sequence-dependent setups and quality restrictions
6. Advanced semiconductor fabrication process control using dual filter exponentially weighted moving average
7. Fault detection of cycle-based signals using wavelet transform in FAB processes
8. A scheduling algorithm for the reentrant shop: an application in semiconductor manufacture
9. A simulation based heuristic for serial inventory systems under fill-rate constraints
10. Contract-collaboration network method for modeling manufacturing resource control workflows
11. Supply Chain Network Design and Transshipment Hub Location for Third Party Logistics Providers
12. One-class support vector machines—an application in machine fault detection and classification
13. Operation sequence and tool selection in flexible manufacturing systems under dynamic tool allocation
14. Assignment problems in single-row and double-row machine layouts during slow and peak periods
15. Update Cycle Detection Method of Control Limits using Control Chart Performance Evaluation Model
16. Point and Interval Estimation Method for Auto-regressive Model with Nonnormal Error
17. A Study of Estimation Method for Auto-Regressive Model with Non-Normal Error and Its Prediction Accuracy
18. Advanced Nano-Scale Process Control Using the Back-Propagation Network and Dual Filter Exponentially Weighted Moving Average
19. Fault Detection of Unbalanced Cycle Signal Data Using SOM-based Feature Signal Extraction Method
20. Control Chart Pattern Recognition of Manufacturing Process Using Wavelet Feature-Based Artificial Neural Networks
21. Model Parameter Based Fault Detection for Time-series Data
22. Dispatching to Minimize Flow Time for Production Efficiency in Non-Identical Parallel Machines Environment with Rework
23. Advanced semiconductor fabrication process control using dual filter exponentially weighted moving average
24. A solution for glasses assembly problem in cell processes of LCD via optimization-based approach
25. Dynamic deadband control in semiconductor manufacturing
26. A semiconductor yields prediction using stepwise support vector machine
27. Improved Dispatching Algorithm for Satisfying both Quality and Due Date
28. A scheduling algorithm for the reentrant shop: an application in semiconductor manufacture
29. Data Mining Approaches for Packaging Yield Prediction in the Post-fabrication Process.
30. Online learning of the cause-and-effect knowledge of a manufacturing process
31. A batch scheduling scheme for the workcenter that supplies parts to a mixed-model assembly line
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